Veoneer Us, Inc.

Grant Scott

Vincent Colarossi

Stuart Koch

Michael C Campbell

A system for testing a subject transistor with constant power. The system may include an amplifier, a measurement voltage source, and a exercise voltage source. The amplifier may have an output connected to a gate of the subject transistor. The amplifier may have a first input and a second input. The measurement voltage source may be connected to the first input of the amplifier for use in measuring characteristics of the subject transistor. The exercise voltage source may be connected to the first input of the amplifier for exercising the subject transistor. The second input of the amplifier may be connected to a source of the subject transistor through a resistor.

Constant power circuit with variable heating and measurement current capability

A restraint control module is provided in this disclosure. The restraint control module is configured to communicate a sync pulse to a sensor. The control module may include a sync pulse driver circuit and a memory. The memory may store the waveform profile of a sync pulse. The sync pulse driver circuit generates a sync pulse in response to the waveform profile stored in the memory. The sync pulse may be transmitted to one or more sensors. The waveform profile stored in the memory may be derived from a sync pulse with reduced electro-magnetic emissions by applying spectrum analysis.

Growing community of inventors

South Lyon, MI, United States of America

Grant Scott