Teradyne, Inc.

Analogic Corporation

Govindarajan T Srinivasan

Peter A Reichert

Joseph Francis Wrinn

Michael W Hamblin

Carl R Crawford

Zhengrong Ying

Chitra Subramanian

Anuradha Aiyer

Nima Shokrollahi

Dennis R LaFosse

According to one embodiment, a method for processing one or more X-ray images includes: receiving at least one image of the one or more X-ray images, the one or more X-ray images being of an assembly extending along a plane; based on the at least one image, autonomously determining a respective displacement value for each of portions of the assembly with respect to one or more directions of the plane, each of the displacement values being determined relative to a respective actual value; storing the displacement values; and applying a rule to the stored displacement values, the rule being for determining a defect status of the assembly.

X-ray inspection of solder reflow in high-density printed circuit board applications

According to one embodiment, a calibration system for calibrating image data produced by an imaging system is provided. The calibration system includes a processor configured for: receiving the image data from the imaging system; receiving a plurality of reference values from the imaging system; and calibrating the image data using the reference values. The reference values correspond to air image data produced by the imaging system.

Method of and system for calibration of inspection systems producing X-ray images

According to one embodiment, a system for linearizing image data corresponding to one or more objects and output by an imaging device is provided. The system includes a processor configured for: receiving the image data from the imaging device; and producing a generally linear relationship between the image data and a thickness of the one or more objects. The generally linear relationship is produced according to the equation I is an intensity of the image data, Iis an intensity of energy produced by the imaging device for outputting the image data, &#x3bc; is an attenuation coefficient of the one or more objects, and l is the thickness of the one or more objects.

Method of and system for obtaining linear data for object scanned using non-collimated, poly-energetic X-rays

A method of and a system for extracting 3D bag images from continuously reconstructed 2D image slices are provided. The method detects the boundaries of baggage in the reconstructed images, and provides better flexibilities for threat detection and displaying. The method comprises detecting starting and ending slices using multiple slices, counting bag slices, splitting 3D bag images when maximum number of slices of a 3D bag image is reached, and creating overlapping slices for the split 3D bag images.

Method of and system for extracting 3D bag images from continuously reconstructed 2D image slices in computed tomography

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Portsmouth, NH, United States of America

Govindarajan T Srinivasan