Cirrus Logic Inc.

Gordon Russell

Andrew James Howlett

Mark McCloy-Stevens

Andrew Buist

Dave Smith

Huy Binh Le

This application relates to monitoring of electronic devices () and in particular to methods and apparatus for the detection and recording of an electrical overstress applied to a connector () of the device. The apparatus describes an integrated circuit () of the host device having a first set of one or more circuit contacts () for connection to a connector () of a host electronic device. The circuit has an electrical overstress monitor () for detecting and recording an electrical overstress comprising a voltage exceeding a predetermined parameter applied to at least one of said first set of circuit contacts. The electrical overstress monitor () may have an overvoltage detector () and may have a memory () for recording the occurrence of an overvoltage and/or a communication module () for communicating with other components of the host device in the event of an electrical overstress.

Monitoring of devices

Circuitry for controlling current between a load and a power supply, the circuitry comprising: an output stage comprising: an input node configured to be coupled to the power supply; and an output node configured to be coupled to the load; and one or more control nodes for controlling a conduction path between the input node and the output node; and protection circuitry coupled to the one or more control nodes, the protection circuitry configured to break the conduction path between the input node and the output node when a load voltage at the output node exceeds a supply voltage at the input node, wherein the protection circuitry comprises: an active protection circuit configured to break the conduction path when the supply voltage exceeds an operational threshold of the active protection circuit; and a passive protection circuit configured to break the conduction path when the supply voltage is below an operation threshold of the active protection circuit.

Protection circuitry

This application relates to monitoring of electronic devices () and in particular to methods and apparatus for the detection and recording of an electrical overstress applied to a connector () of the device. The apparatus describes an integrated circuit integrated circuit () of the host device having a first set of one or more circuit contacts () for connection to a connector () of a host electronic device. The circuit has an electrical overstress monitor () for detecting and recording an electrical overstress comprising a voltage exceeding a predetermined parameter applied to at least one of said first set of circuit contacts. The electrical overstress monitor () may have an overvoltage detector () and may have a memory () for recording the occurrence of an overvoltage and/or a communication module () for communicating with other components of the host device in the event of an electrical overstress.

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Fife, United Kingdom

Gordon Russell