Christie, Incorporated

Ultra Stereo Labs Inc.

Gordon Henry Jennings, Iii

James A Cashin

Earl R Hibbard

Bevan Wright

Steinar Larsen

The present invention is a system and method to quickly and accurately measure the luminance and luminance distribution of a light on the surface of an object so that the position of the lamp can be adjusted relative to the projector optics to obtain the best luminance available for that object. A scanning light receiver, which produces an optical image of the object whose luminance is to be tested, is set up so that it may view a substantial portion of the surface of the object. The light receiver is connected to a analyzer and control unit ('ACU') to which it sends an electronic image representing the reflected luminance of the surface during each scan. The reflected light that is detected by the light receiver is then analyzed by the ACU to determine the luminance levels and distribution across a substantial portion of the surface by measuring the voltage of each pixel detected by the light receiver measured against the voltage produced by a black level. Once this analysis is complete, the ACU sends the results to a driver interface unit which is connected to a light source position controller in the projector which continuously adjusts the position of the light source relative to the projector optics until optimal luminance and luminance distribution is achieved across the viewing surface. For example, using the method and system of the present invention, the position of the lamp continually and automatically may be fine tuned until optimum luminance is achieved.

Growing community of inventors

San Luis Obispo, CA, United States of America

Gordon Henry Jennings, Iii