Cypress Semiconductor Corporation

Cypress Semiconductor Corpoartion

Gopal Patil

Babak A Taheri

Sanjeev K Maheshwari

A method of measuring the temperature of device under test includes the steps of injecting a first current into an on-chip diode wherein a die containing the on-chip diode is under test. A second current is injected into the on-chip diode. A junction temperature is calculated based on the first current and the second current.

System and method for measuring the temperature of a device

A phase locked loop circuit, system, and method of operation are provided. The phase-locked loop (PLL) includes a first PLL and a second PLL. The first PLL is nested inside the second PLL. According to one embodiment, the first PLL is coupled to the output of a surface acoustic wave (SAW) resonator, and includes first divider coupled within a feedback loop of the first PLL. The second PLL is coupled between an input of the overall PLL circuit, and output from the first PLL and the first divider. According to a second embodiment, the second PLL includes a SAW voltage-controlled oscillator (VCSO) and a second divider coupled to an output of the first PLL. Regardless of whether the first or second embodiments are contemplated, the nested first and second PLL circuits provide an agile, low phase noise, clock synthesizer and jitter attenuator hereof.

Agile, low phase noise clock synthesizer and jitter attenuator

A mixed signal method and system for tuning a voltage controlled oscillator is described. The method includes dividing a frequency range of an oscillator circuit into a plurality of regions, digitally selecting and tuning one of the plurality of regions of the divided frequency range of the oscillator circuit, and further tuning the selected region of the frequency range of the oscillator circuit via one or more analog tuning elements.

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San Jose, CA, United States of America

Gopal Patil