Samsung Electronics Co., Ltd.

Goeun Jung

Kyungryun Kim

Sangyong Yoon

Sang-Hyun Joo

Seung-Cheol Han

Kyehyun Kyung

A method of operating a storage device includes a nonvolatile memory device, a controller configured to control the nonvolatile memory device and a temperature sensor configured to measure a temperature of the nonvolatile memory device. The method includes calculating an average sensing temperature of a sensing temperature measured by the temperature sensor for a period of time, and periodically calculating an elapsed time of data after the data is programmed in the nonvolatile memory device based upon the average sensing temperature.

Storage device, operation method of storage device and method of accessing storage device

One embodiment includes obtaining programming order information for the memory area from a first table based on address information. The programming order information indicates an order in which the memory area was programmed. The embodiment further includes determining an estimated elapsed time by accessing a second table based on the obtained programming order information. The estimated elapsed time indicating time that has elapsed since the portion of the memory area was last programmed. The embodiment includes controlling the memory based on the estimated elapsed time.

Growing community of inventors

Hwaseong-si, South Korea

Goeun Jung