Adv Antest Corporation

Go Utamaru

Kouji Miyauchi

Kotaro Hasegawa

A test apparatus includes: an electrical connection unit to be electrically connected to a terminal of each of a plurality of light emitting devices to be tested; a light source unit for collectively irradiating the plurality of light emitting devices with light; a measuring unit for measuring a photoelectric signal obtained by photoelectrically converting light irradiated by the light source unit and output via the electrical connection unit by each light emitting device; an acquisition unit for acquiring a correction map including a correction value for correcting a variation in intensity of light with which a position of each light emitting device is irradiated by the light source unit; and a determination unit for determining a quality of each light emitting device on a basis of a measurement result by the measuring unit and the correction map acquired by the acquisition unit.

Test apparatus, test method, and computer-readable storage medium

A test apparatus includes: an electrical connection unit configured to be electrically connected to a light emitting device panel having a plurality of cells each including a light emitting device and arranged in a row direction and a column direction; a light source unit configured to collectively irradiate the plurality of cells with light; a reading unit configured to read, for each row of the light emitting device panel, a photoelectric signal obtained by photoelectrically converting the light in each of two or more of the cells arranged in the column direction by the light emitting device; a measuring unit configured to measure a photoelectric signal read from each of the plurality of cells; and a determination unit configured to determine a quality of each of the plurality of cells on a basis of a measurement result of the measuring unit.

A test apparatus includes: an electrical connection unit electrically connected to a terminal of each of a plurality of light emitting devices to be tested; a light source unit for collectively irradiating the plurality of light emitting devices with light; an electrical measurement unit for measuring a photoelectric signal obtained by photoelectrically converting the light irradiated from the light source unit by each light emitting device; a light emission control unit for causing at least one light emitting device to be subjected to light emission processing to emit light; a light measuring unit for measuring light emitted by the at least one light emitting device to be subjected to the light emission processing; and a determination unit determining a quality of each light emitting device on the basis of a measurement result of the electrical measurement unit and a measurement result of the light measuring unit.

A test apparatus includes an electrical connection unit electrically connected to respective terminal of each of a plurality of LEDs to be tested, a light source unit which collectively irradiates the plurality of LEDs with light, a measuring unit which measures a photoelectric signal that each of the plurality of LEDs outputs via the electrical connection unit after photoelectrically converting the light with which the light source unit irradiates the plurality of LEDs, and a determination unit which determines pass or fail of each of the plurality of LEDs based on the measurement results by the measuring unit.

Test apparatus for determining pass or fail of LEDs, test method and computer-readable medium

A PLL circuit according to the present invention includes a VCO that outputs an VCO signal having a frequency according to an input voltage, a loop filter that feeds a voltage according to an input current to the VCO, a phase comparator that outputs a phase difference pulse having a width according to a phase difference between a first input signal and a second input signal, a charge pump circuit that receives the phase difference pulse, and inputs the current to the loop filter, and a phase-difference-pulse stop unit that stops the input of the phase difference pulse to the charge pump circuit in a non-input state in which an REF signal (reference frequency signal) is not input. The first input signal is the REF signal itself or a signal obtained by dividing the frequency of the REF signal, and the second input signal is the VCO signal itself or a signal obtained by dividing the frequency of the VCO signal.

PLL circuit

Provided is a modulation apparatus that quadrature modulates a periodic signal, comprising an I-side signal output section that outputs an I-component signal; a Q-side signal output section that outputs a Q-component signal; a quadrature modulator that quadrature modulates the periodic signal with the I-component signal and the Q-component signal; an I-side correcting section that corrects the I-component signal according to an error of the quadrature modulator; and a Q-side correcting section that corrects the Q-component signal according to the error of the quadrature modulator.

Modulation apparatus, test apparatus and correction method

Provided is a signal generating apparatus that generates an output signal having a designated phase, comprising a phase difference detecting section that outputs a control signal corresponding to a phase difference between a reference signal having a prescribed period and the output signal; an oscillating section that generates a periodic signal having a frequency corresponding to the control signal; and a phase shifting section that outputs the output signal to have a phase that is shifted from the phase of the periodic signal by a designated phase amount.

Growing community of inventors

Ibaraki, Japan

Go Utamaru