Olympus Corporation

Go Ryu

Terumasa Morita

Daisuke Yokoi

Masato Yabe

Toshiaki Matsuzawa

Yukio Eda

Hideki Obuchi

Hironori Utsugi

Norio Maruyama

To prevent unwanted exposure of a specimen with excitation light despite magnification switching, a microscope of the present invention includes: a detection optical system that detects fluorescence emitted from the specimen; a light-sheet illumination optical system, serving as an excitation light source, that causes planar excitation light to be incident along a direction intersecting an optical axis of the detection optical system; and a control section that, when the magnification of the detection optical system is raised, controls the light-sheet illumination optical system so as to reduce a radiation width of the excitation light made incident on the specimen by the light-sheet illumination optical system.

Microscope and microscope image acquisition method

A microscope apparatus includes a detection optical system that detects fluorescence produced in a specimen immersed in a medium having a different refractive index from air and accommodated in a container and acquires a fluorescence image. An illumination device focuses excitation light emitted from an excitation-light source, in the form of a plane along a plane intersecting an optical axis of the detection optical system and makes the planar excitation light incident on the specimen in the container. A driving unit moves the specimen in a direction of an optical axis of a cylindrical lens. An illumination control unit adjusts a focal position of the illumination device based on a movement amount of the specimen moved by the driving unit such that an air-equivalent length along an optical path of the excitation light from the illumination device to the optical axis of the detection optical system remains constant.

Microscope, sheet-illumination microscope, and microscope-image acquiring method

A microscope apparatus including a light source device, a storage table, and a setting controller is provided. The light source device includes a light intensity adjuster which changes light intensity of an illumination light of plural different wavelength regions selectively extracted from light emitted from a light source, and thereby emitting the illumination light including light of the plural different wavelength regions in such a manner that a light intensity ratio of light of one wavelength region to light of another wavelength region is variable. The storage table stores therein set values of the light intensity adjuster for each of combination patterns of the wavelength regions of the illumination light emitted from the light source device. The setting controller makes the light source device change a setting of the light intensity adjuster based on the set value stored in the storage table according to wavelength designation information which designates a combination pattern of the wavelength regions.

Microscope apparatus

This lens evaluation device comprises a plurality of point light sources arranged on the plane, an imaging unit for picking up an object and obtaining its image, a movement unit for changing the relative distance between the point light source or the imaging unit and the optical system to be evaluated, a storage medium for recording stack images obtained by the imaging unit picking up the images of the plurality of point light sources via the optical system every time the movement unit changes the relative distance, an image position calculation unit for calculating a plurality of image positions from the plurality of pieces of point light source image in the stack image recorded on the storage medium and an aberration acquisition unit for fitting an aberration model function to the plurality of image positions calculated and obtaining an aberration measurement value.

Lens evaluation device

A microscope apparatus comprises a focusing unit for changing the relative position between a specimen and the focus position of an object lens; and a setup unit for setting a plurality of import regions in the optical axis of the object lens, with a position at which a specimen is focused being established as a reference. It further comprises a control unit for obtaining a plurality of extended time exposure images by changing the relative positions from each respective start position to the end position of each of the plurality of import regions by means of the focusing unit under an import condition determined by desired exposure time and emission light volume; and an image generation unit for generating a focal-depth enlarged image by adding together the obtained plurality of extended time exposure images.

Microscope apparatus and focal-depth enlarged image generation method used therefor

A camera obtains an observation image of a sample by capturing the image of the sample on which an ultraviolet light generated by a light source device is irradiated. An image processing unit of a controlling device generates a synthesis observation image of the sample based on a plurality of observation images of the sample, which are obtained by being captured by the camera in the same field of view with switching of the wavelength band of the ultraviolet light irradiated on the sample. A display unit of the controlling device displays the image generated by the image processing unit.

Ultraviolet microscope apparatus

The present invention has a three-dimensional apparatus including a lattice pattern placed in an optical path and having a slit-like light transmitting portion formed of pitches set at fixed intervals, and a projecting optical system that projects a lattice pattern image formed by the lattice pattern on the sample so that the image is inclined at a predetermined angle. A lattice pitch is determined on the basis of set parameters including the magnification of an observing system. A pattern is formed by the lattice pitch. The pattern is used to pick up a deformed lattice pattern image using a TV camera. An image of each position is acquired while shifting the lattice pattern over several levels. A phase is determined. A height is then determined using the difference between the phase and a basic phase corresponding to a pre-provided magnification or the like. The height is then displayed.

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Kawasaki, Japan

Go Ryu