Micron Technology Incorporated

Glenn W Piper

Glen Earl Hush

James J Hofmann

Zhong-Yi Xia

James J Cathey

Dwayne Kreipl

A controller is used with an anodic bonding system that has a charge flowpath for supplying charge to bond materials together. The controller includes a switch and a circuit. The switch is configured to control a flow of the charge through the charge flowpath. The circuit is configured to monitor a rate of the flow, use the rate to determine an amount of the charge supplied for bonding, and based on the amount or rate, operate the switch to control the flow.

Anodic bonding

A remote monitor controller decodes image data destined for a display associated to the controller, and continuously shows the image on the display until another image is provided to the controller. An image generating device, such as a personal computer, provides image data to as many displays as desired. The personal computer sends the image data to a controller associated with each display. The controller then formats the image to be shown on the display, and sits in an endless loop until another image is provided to it. Depending on the speed of the computer network, a range of options is available, from nearly static images that don't often change to full motion video on all of the displays. The controller includes an input module that receives a stream of digital data, a microcontroller that converts the digital data into image display data and stores it into a video RAM, and an output module that sends the stored image to the associated display.

Remote monitor controller

A current measuring circuit for a field emission display includes a testing circuit coupled between a high voltage testing source and the display. The testing circuit includes a sampling circuit formed from a sampling impedance coupled in parallel with a high isolation switch. In one embodiment, the sample circuit is on the high voltage side of the testing source. In another embodiment, the sampling circuit is on the return (low voltage) side of the testing source. In normal operation, the switch is closed to provide the testing voltage directly to the display. During testing, the switch is open so that current flows through the sampling impedance. A sensing circuit coupled to the output of the sampling impedance determines a voltage change in response to opening of the switch. In response to a sensed voltage change, a microprocessor-based controller computes the current drawn by the display. A burn-in system includes a bank of displays within a burn-in oven each selectively coupleable to the testing circuit by respective switches. Another testing system includes separate supply and testing sources each coupled to displays by respective switches. The switches are opened and closed such that the displays are always coupled to one or both of the voltage sources to prevent the switches from being exposed to high voltage swings.

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Meridian, ID, United States of America

Glenn W Piper