Sintx Technologies, Inc.

Other

Amedica Corporation

Pezzotti, Giuseppe

Giuseppe Pezzotti

Bryan J McEntire

Ramaswamy Lakshminarayanan

Nicholas Grimaldi

Kevin Davis

Ryan M Bock

Methods for improving the antibacterial characteristics of biomedical implants and related implants manufactured according to such methods. In some implementations, a biomedical implant comprising a silicon nitride ceramic material may be subjected to a surface roughening treatment so as to increase a surface roughness of at least a portion of the biomedical implant to a roughness profile having an arithmetic average of at least about 500 nm Ra. In some implementations, a coating may be applied to a biomedical implant. Such a coating may comprise a silicon nitride ceramic material, and may be applied instead of, or in addition to, the surface roughening treatment process.

Antibacterial biomedical implants and associated materials, apparatus, and methods

Methods for improving the antibacterial, osteoconductive, and/or osteoinductive characteristics of silicon nitride and/or other ceramic materials, particularly to make them more suitable for use in manufacturing biomedical implants. In some embodiments and implementations, the surface chemistry and/or morphology of a silicon nitride bioceramic may be modulated significantly through thermal, chemical, and/or mechanical treatments to achieve such advantageous results. A portion of the resulting material, such as a glaze or upper layer of the material, may be separately produced as a powder or frit, for example, and used in manufacturing biomedical implants and/or other products, such as by using such portion of the material as a coating or filler. In other embodiments the surface material may be separately manufactured as a silicon oxynitride monolith.

Ceramic and/or glass materials and related methods

The stress measuring method of the present claimed invention includes an external force impressing process that applies an external force to a specimen, an electron beam irradiating process that irradiates an electron beam to the specimen, a spectroscopy process that conducts spectroscopy on light generated from the specimen by the above-mentioned electron beam irradiating process so as to obtain a spectrum, and a stress calculating process that obtains a stress based on a spectrum shift between a specimen spectrum obtained by irradiating the electron beam on the above-mentioned specimen and a stress impressed spectrum obtained by irradiating the electron beam on the specimen in a state that a stress exists due to the above-mentioned external impressing process.

Stress measuring device

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Kyoto, Japan

Giuseppe Pezzotti