General Electric Company

Girijesh Kumar Yadava

Paavana Sainath

Hewei Gao

Adam Israel Cohen

Jiang Hsieh

Xiaoye Wu

Brian Edward Nett

Yannan Jin

Dan Xu

Debashish Pal

Yannan Jim

Systems and methods for iterative multi-material correction are provided. A system includes an imager that acquires projection data of an object. A reconstructor reconstructs the acquired projection data into a reconstructed image, utilizes the reconstructed image to perform a multi-material correction on the acquired projection data to generate a multi-material corrected reconstructed image, and utilizes the multi-material corrected reconstructed image to perform one or more iterations of the multi-material correction on the projection data to generate an iteratively corrected multi-material corrected image.

Systems and methods for iterative multi-material correction of image data

A method includes acquiring projection data of an object from a plurality of detector elements, reconstructing the acquired projection data into a first reconstructed image, and performing material characterization of an image volume of the first reconstructed image to reduce a number of materials analyzed in the image volume to two basis materials. Performing material characterization includes utilizing a generalized modeling function to estimate a fraction of at least one basis material within each voxel of the image volume. The method also includes generating a re-mapped image volume for the at least one basis material of the two basis materials, performing forward projection on at least the re-mapped image volume for the at least one basis material to produce a material-based projection, and generating multi-material corrected projections based on the material-based projection and a total projection attenuated by the object, which represents both of the two basis materials.

System and method for multi-material correction of image data

An imaging system includes a rotatable gantry for receiving an object to be scanned, a generator configured to energize an x-ray source to generate x-rays, a detector positioned to receive the x-rays that pass through the object, and a computer. The computer is programmed to obtain knowledge of a metal within the object, scan the object using system scanning parameters, reconstruct an image of the object using a reconstruction algorithm, and automatically select at least one of the system scanning parameters and the reconstruction algorithm based on the obtained knowledge.

System and method for reducing high density artifacts in computed tomography imaging

A method is provided. The method includes acquiring projection data of an object from a plurality of pixels, reconstructing the acquired projection data from the plurality of pixels into a reconstructed image, performing material characterization and decomposition of an image volume of the reconstructed image to reduce a number of materials analyzed in the image volume to two basis materials. The method also includes generating a re-mapped image volume for at least one basis material of the two basis materials, and performing forward projection on at least the re-mapped image volume for the at least one basis material to produce a material-based projection. The method further includes generating multi-material corrected projections based on the material-based projection and a total projection attenuated by the object, which represents both of the two basis materials, wherein the multi-material corrected projections include linearized projections.

Anode targets for an x-ray tube and methods for controlling x-ray tubes for x-ray systems are provided. One x-ray system includes a field-generator configured to generate a field, an electron beam generator configured to generate an electron beam directed towards a target and a voltage controller configured to control the electron beam generator to produce an electron beam at a first energy level and an electron beam at a second energy level. The x-ray system also includes a field-generator controller configured to control a field to deflect at least one of the electron beams, wherein the electron beam, at the first energy level, impinges on the target at a first contact position and the electron beam, at the second energy level, impinges on the target at a second contact position. The at the first contact position and at the second contact position is configured to filter x-rays.

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Waukesha, WI, United States of America

Girijesh Kumar Yadava