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Amber Precision Instruments, Inc.

Giorgi Muchaidze

Besarion Chikhradze

Kyung Jin Min

David Johannes Pommerenke

Iuri Kalandarishvili

Hamed Kajbaf

A system and method for testing a device under test (DUT) combines measurement data of field components values made at different sampling locations away from the DUT with computer-aided design layout of the DUT. The combined computer-aided design layout of the DUT and the measurement data can then be displayed for analysis.

Using computer-aided design layout in scanning system

A system and method for electrostatic discharge (ESD) testing devices under test (DUTs) uses an ESD gun attached to a robotic arm to execute ESD testing processes. The system and method also uses a relay station to place a DUT after an ESD testing process is performed on one major side of the DUT so the ESD testing can be performed on the other major side of the DUT.

System and method for electrostatic discharge testing of devices under test

A system and method for measuring near field information of a device under test (DUT) uses a reference probe and a measurement probe that are configured to sense a field. A probe calibration factor is used to determine corresponding field values for signals from the measurement probe at sampling locations about the DUT. The probe calibration factor is derived from measured signals about a conductive trace using a probe and simulated field information for the conductive trace when subjected to a simulated reference signal.

System and method for measuring near field information of device under test

A system and method for electrostatic discharge (ESD) testing devices under test (DUTs) uses an ESD gun attached to a robotic arm to execute ESD tests. The system and method also uses cameras positioned around a DUT placed on a testing table to define at least one test point on a surface of the DUT. Using the defined test point, as well as settings on the ESD gun and a testing process scenario that includes actions to be executed by the system, the testing process is performed by the system.

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Sunnyvale, CA, United States of America

Giorgi Muchaidze