Fluke Corporation

Ginger M Woo

Ronald Steuer

Gloria M Chun

Jeffrey E Worones

Ricardo Rodriguez

Paul A Richer

Christopher D Corrigan

Brian Stanley Aikins

Roger L Howell

Scott M Tsukamaki

Matthew Carl-Robert Bannister

David J Gibson

Luis R Silva

Simon J Page

Chris Corrigan

Brian D Painting

Yinzi Liang

Electrical test device

A sensor probe includes a body having first and second channels that are spaced apart and extend through the body approximately parallel to each other. A first end of a Rogowski coil is fixed within the first channel. The Rogowski coil passes through the second channel and loops back to the first channel where a second end of the Rogowski coil is selectively insertable into the first channel opposite the first end of the Rogowski coil. A non-contact sensor coupled to the body is positioned between the first and second channels to measure a parameter of an insulated conductor situated within the loop formed by the Rogowski coil. The size of an interior region within the loop is selectively adjustable by sliding movement of the Rogowski coil within the second channel.

Non-contact voltage measurement with adjustable size rogowski coil

Power quality analyzer

Accessories are removably received by a non-contact electrical detector for measuring an electrical characteristic without galvanic contact between the accessory and a non-contact sensor in the non-contact electrical detector. In some embodiments, an accessory is positioned in a gap between first and second extensions of the non-contact electrical detector. In some embodiments, an accessory includes first and second recesses on opposite sides of the accessory. First and second clamp arms of a non-contact electrical detector are inserted within the first and second recesses to removably hold the accessory. An external conductive prong of the accessory is electrically coupled, or is selectively electrically coupleable, with an internal conductive prong of the accessory. The external conductive prong is configured to be inserted into a receptacle of an electrical outlet. In use, the accessory positions the internal conductive prong within a sensing area of the non-contact electrical sensor of the non-contact electrical detector.

Accessory for utilization with non-contact electrical detector

Clamp meter

One or more implementations of the present disclosure are directed to sensor probes of measurement systems for measuring a plurality of electrical parameters, (e.g., voltage, current) of a conductor and methods for measuring same. In at least one implementation, the sensor probe integrates a Rogowski coil and a non-contact voltage sensor that are arranged relative to each other such that when positioned to measure a conductor, such as a wire, the Rogowski coil and the non-contact voltage sensor are held in proper position for measurement.

Sensor probe with combined non-contact sensor and a Rogowski coil

Non-contact voltage measurement with adjustable size Rogowski coil

A sensor probe includes a body, a sleeve that is moveable along the body between open and closed positions, a clamp having first and second jaws that contain an interior region within the clamp, and a non-contact sensor coupled to the sleeve and positioned at or near a perimeter of the interior region within the clamp. When the sleeve is in the open position, the first and second jaws create a gap that allows an insulated conductor to pass into the interior region within the clamp. When the sleeve is in the closed position, the first and second jaws close the gap and thereby close the interior region within the clamp. The size of the interior region is reduced when the sleeve is moved toward the closed position. The non-contact sensor is configured to detect an electrical parameter of the insulated conductor without requiring galvanic contact with the conductor.

Sensor probe with clamp having adjustable interior region for non-contact electrical measurement

Documenting process calibrator

Self-leveling laser level

Systems and methods are provided for measuring electrical parameters in a conductor without requiring a galvanic connection. A device includes a body and a clamp jaw assembly movable between an open position that allows a conductor to be moved into a measurement area, and a closed position that secures the conductor within the measurement area. The clamp jaw assembly includes sensors positioned inside a clamp jaw of the clamp jaw assembly. A user may apply a force to an actuator to move the clamp jaw assembly from the closed position into the open position so that the conductor may be positioned and secured in the measurement area. The clamp jaw assembly includes a visual indicator to guide the user to position the conductor within an optimal region in the measurement area. The clamp jaw assembly is sized and dimensioned to automatically position the conductor within the optimal region during measurements.

Non-contact electrical parameter measurement device with clamp jaw assembly

Growing community of inventors

Shoreline, WA, United States of America

Ginger M Woo