Sun Microsystems, Inc.

University of Washington

Ati Technologies Inc.

Gin S Yee

Pradeep R Trivedi

Claude R Gauthier

Tyler J Thorp

Sudhakar Bobba

Dean Liu

Lynn Ooi

Drew George Doblar

Lin Chen

Joseph D Macri

Arvind Bomdica

David J Greenhill

Raymond A Heald

Chaim Nmi Amir

Joseph Raymond Siegel

Siji Menokki Kandiyil

Sam Huynh

Edward Lee

Larry E McMurchie

James Tran

Shaoping Ge

Carl Sechen

Hiok-Tiaq Ng

Ronald T Christopherson

John Ling

Jennifer Ho

An IO method and system for bit-deskewing are described. Embodiment includes a computer system with multiple components that transfer data among them. In one embodiment, a system component receives a forward strobe signal and multiple data bit signals from a transmitting component. The receiving component includes a forward strobe clock recovery circuit configurable to align a forward strobe sampling clock so as to improve sampling accuracy. The receiving component further includes at least one data bit clock recovery circuit configurable to align a data bit sampling clock so as to improve sampling accuracy, and to receive a signal from the forward strobe clock recovery circuit that causes the data bit sampling clock to track the forward strobe sampling clock during system operation.

Bit-deskewing IO method and system

An analog debugging block of an integrated circuit includes a multiplexor, a buffer, and a voltage-controlled oscillator. An analog voltage signal-of-interest is selectively passed through the multiplexor to the buffer. The buffer outputs an analog control voltage dependent on the selected analog voltage signal-of-interest. The analog control voltage serves as an input to the voltage-controlled oscillator and is used to control a frequency of a digital output signal generated from the voltage-controlled oscillator. The digital output signal from the voltage-controlled oscillator is driven off-chip, whereupon a frequency of the digital output signal is determined and compared against a collection of known frequencies that correspond to particular known voltages of the analog voltage signal-of-interest, thereby resulting in a determination of the value of the selected analog voltage signal-of-interest.

IC analog debugging and calibration thereof

A method and apparatus for compensating for age related degradation in the performance of integrated circuits. In one embodiment, the phase-locked loop (PLL) charge pump is provided with multiple legs that can be selectively enabled or disabled to compensate for the effects of aging. In an alternate embodiment, the power supply voltage control codes can be increased or decreased to compensate for aging effects. In another embodiment, a ring oscillator is used to approximate the effects of NBTI. In this embodiment, the frequency domain is converted to time domain using digital counters and programmable power supply control words are used to change the operating parameters of the power supply to compensate for aging effects.

Compensation technique to mitigate aging effects in integrated circuit components

A method and apparatus for sensing an aging effect on an integrated circuit using a sensor disposed on the integrated circuit and arranged to generate an output dependent on a condition of an element within the sensor. A processor operatively connected to the sensor is arranged to indicate a code dependent the output.

Embedded integrated circuit aging sensor system

A method for synchronizing a data signal and a clock signal has been developed. The method first generates two separate intermediate data signals. The intermediate data signals lag the input data signal. The separate durations of the two lagging signals are combined to form an output data signal that is synchronized with the system clock signal.

Method for synchronizing clock and data signals

A method and apparatus for assigning a set of region-based voltage drop budgets to an integrated circuit is provided. Further, a method for partitioning an integrated circuit into optimal voltage drop regions includes analyzing the integrated circuit for worst-case voltage drop data. The worst-case voltage drop data is used to partition the integrated circuit into a set of voltage drop regions, wherein each voltage drop region is assigned a region-based voltage drop budget. The region-based voltage drop budget assigned to a particular voltage drop region is based on a worst-case voltage drop experienced by that voltage drop region.

Region-based voltage drop budgets for low-power design

A method and apparatus for improving the timing accuracy of an integrated circuit through region-based voltage drop budgets is provided. Further, a method for performing timing analysis on an integrated circuit partitioned into voltage drop regions is provided. During the timing analysis, a set of logic paths segments in each voltage drop region is tested to ensure that the integrated circuit meets a set of predefined timing requirements. Logic path segments that reside in different voltage drop regions are tested using a supply voltage inputted by the respective voltage drop region.

Accuracy of timing analysis using region-based voltage drop budgets

A temperature monitoring technique that eliminates the need for bipolar devices. In one embodiment of the present invention, a long-channel MOS transistor is configured in a diode connection to sense change in temperature. The diode drives a linear regulator and an oscillator. The oscillator in turn drives a counter, which counts pulses for a fixed period of time. The system clock on the chip is used as a temperature-independent frequency to generate a count. The temperature-dependent frequency is counted for a fixed number of system clock cycles. The present invention eliminates band gap circuitry currently used in most thermal sensing devices to provide a temperature-independent reference.

On-chip temperature measurement technique

A device that uses an input clock signal to generate an output clock signal with a desired frequency is provided. The device uses a voltage controlled delay element that outputs a reset signal to a flip-flop dependent on a bias signal and the input clock signal. When triggered, the flip-flop outputs a transition on the output clock signal, which, in turn, serves as an input to a duty cycle corrector that generates the bias signal dependent on the configuration of the duty cycle corrector. The duty cycle corrector may be configured to generate the bias signal so as to be able to operatively control the duty cycle of the output clock signal.

Duty cycle corrector

A clock frequency multiplier design is provided. The clock frequency multiplier includes an input stage arranged to receive an input clock signal, a first clock cycle generator stage operatively connected to the input stage and arranged to generate a low pulse on a first signal dependent on a low phase of the input clock signal, a second clock cycle generator stage operatively connected to the input stage and arranged to generate a low pulse on a second signal dependent on a high phase of the input clock signal, and an output stage operatively connected to the first clock cycle generator stage and the second clock cycle generator stage and arranged to output a high pulse on an output clock signal for every low pulse on the first signal and the second signal.

Clock frequency multiplier

A method and apparatus for monitoring a temperature on an integrated circuit that includes a thin gate oxide transistor. A temperature monitoring system that includes a thick gate oxide transistor is provided. The temperature monitoring system includes a temperature independent voltage generator, a temperature dependent voltage generator that includes a thick gate oxide transistor, and a quantifier operatively connected to the temperature independent voltage generator and temperature dependent voltage generator.

On-die thermal monitoring technique

A bias generator adjustment system adjusts a PLL or DLL bias generator dependent on negative bias temperature instability effects in an integrated circuit. The bias generator adjustment system uses an aging independent reference circuit and a bias circuit to operatively adjust a bias generator such that transistor 'aging' effects that occur over the lifetime of an integrated circuit are compensated for or corrected.

Negative bias temperature instability correction technique for delay locked loop and phase locked loop bias generators

A charge pump is arranged to generate a current dependent on a phase difference between a first signal and a second signal. A reference circuit is operatively connected to the charge pump and arranged to adjust the charge pump so that the charge pump is independent of an aging effect.

Variation reduction technique for charge pump transistor aging

A dual edge-triggered flip-flop that may be programmably reset independent of a clock signal is provided. Using an externally generated reset value, the dual edge-triggered flip-flop may be asynchronously programmed to reset to either a logical high or a logical low. Further, a dual edge-triggered flip-flop that may be set to multiple triggering modes is provided. Using an externally generated enable signal, the dual edge-triggered flip-flop may be set to function as a single edge-triggered or a dual edge-triggered device. Thus, the dual edge-triggered flip-flop may be used multiple types of computing environments.

Dual edge-triggered flip-flop design with asynchronous programmable reset

A clock detect indicator capable of determining the presence of high and low frequency clock signals is provided. The clock detect indicator, which operates independent of a reference clock, has detection circuitry that determines whether a particular clock signal has alternating high-to-low and low-to-high transitions. Based on the determination, the clock detect indicator outputs a transition on a clock detect indication signal. Further, a method for detecting a clock signal in an integrated circuit is provided.

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Sunnyvale, CA, United States of America

Gin S Yee