Commissariat a L'energie Atomique

Commissariat &#xc0; L'&#xc9;nergie Atomique Et Aux &#xc9;nergies Alternatives

Gilles Grand

Pierre Gidon

Laurent Frey

Patrick Pouteau

Pierre Ferdinand

Sylvain Magne

Salim Boutami

Pierre Labeye

Yohan Desieres

Thierry Leroux

Patrick Chaton

Etienne Quesnel

Vincent Delisle

Michel Darboux

Pierre Barritault

Pascale Parrein

Jerome Petit

Frederic Moisan

An optical filter for filtering an electromagnetic radiation of variable angle of incidence, includes a stack of at least one dielectric or semi-conductor layer arranged between two partially reflective layers, said stack defining a set of Fabry-P&#xe9;rot cavities set to a predetermined wavelength. The average refractive index of the dielectric or semi-conductor layer is variable in a plane orthogonal to the direction of the stack so as to compensate the effects of the variation in the angle of incidence of the electromagnetic radiation on the transmission spectrum of the cavities.

Optical filter suitable for dealing with a radiation of variable incidence and detector including said filter

Filtering matrix structure comprising at least three color filters and a plurality of near Infrared filters, each one of the color filters and the near Infrared filters having an optimum transmission frequency, wherein the filtering matrix structure is made of n metal layers (m, m, m) and n substantially transparent layers (d, d, d) which alternate between a first metal layer (m) and an nsubstantially transparent layer (d), each of the n metal layers (m, m, m) having a constant thickness and at least one substantially transparent layer having a variable thickness which sets the optimum transmission frequency of each color filter and each near Infrared filter, n being an integer larger than or equal to 2. Application to 3D mapping and imaging.

Filtering matrix structure, associated image sensor and 3D mapping device

The invention relates to an optical filter structure composed of at least two adjacent elementary optical filters, an elementary optical filter being centred on an optimum transmission frequency, characterised in that it comprises a stack of n metallic layers (m-m) and n&#x2212;1 dielectric layers (d-d), each metallic layer alternating with a dielectric layer such that the central layer in the stack is a metallic layer (m), each of the layers in the stack having a constant thickness except for the central metallic layer for which the varying thickness fixes the optimum transmission frequency of an elementary filter.

Wavelength optical filter structure and associated image sensor

The invention relates to an optical filtering structure consisting of a set of at least two elementary optical filters (R, V, B), an elementary optical filter being centered on an optimum transmission frequency, characterized in that it comprises a stack of n metal layers (m, m, m) and n substantially transparent layers (d, d, d) which alternate between a first metal layer (m) and an nsubstantially transparent layer (d), the n metal layers (m, m, m) each having a constant thickness and at least one substantially transparent layer having a variable thickness which sets the optimum transmission frequency of an elementary optical filter, n being an integer larger than or equal to 2. Application to miniature image sensors.

Optical filtering matrix structure and associated image sensor

The invention relates to a plasmon resonance optical detection device including a stack of layers comprising:

Optical detection structure for a plasmon resonance sensor

A device for measuring the dimensional or structural characteristics of an object. A detector forms an optical Fourier transform image of an elemental surface of the object in an image focal plane. A processor produces data relating to at least one dimensional and/or structural characteristic of the object from the information provided by the detector.

Use of optical fourier transform for dimensional control in microelectronics

This device comprises a device (DD) for demultiplexing these lines in terms of wavelength, a device (DM) for measuring, by filtering, the wavelengths of the demultiplexed lines, comprising, for each of these lines, a measuring channel (VM) provided with a filter and a reference channel (VR), and means (MP) for the photodetection, for each line, of the light intensity transmitted by the corresponding measuring and reference channels. The wavelength of each of these lines is determined by calculating the ratio of the intensities thus detected. Application to the monitoring of structures.

Device for reading spectral lines contained in an optical spectrum

A micromonochromator is formed on a substrate and includes a diffraction device ( ) associated with an entry that includes at least one entry point and an exit that includes at least one exit point. A mobile arrangement of light guidance ( - - ) is associated with the entry or the exit or both, and a recovery device ( ) is provided by the exit. The mobile arrangement includes at least one mobile beam integrated in the substrate and equipped with at least one light guide. The mobile beam is able to sweep the entry and/or exit in a continuous manner.

Micromonochromator and method for producing same

The present invention relates to a device for demultiplexing spectrum lines contained in an optical spectrum. This device comprises a energy separator (,) and selective wavelength light reflectors (,), each selective wavelength light reflector having a wavelength bandpass that contains the spectral region associated with one of the lines and that, therefore, reflects only this particular line. Applications to surveying constructions, such as buildings and aircraft.

Device for demultiplexing light paths contained in an optical spectrum

This device comprises a planar input area (,), a planar output area (,), a microguides array (,) laid out between these areas, means (,) of inputting a light beam associated with the input area and means (,) of outputting a light beam associated with the output area. According to the invention, at least two pieces (,) are formed, one comprising one part of at least one of the areas and the corresponding associated means, the other comprising the other part of this area and the other components of the device, and the pieces are added on so as to form the complete device and to adjust the wave length of this device. Application to optical telecommunications and optical spectrometry.

Phased array device or phasar and process for manufacturing this device

A support designed for hybrid optoelectronics, including at least one integrated optical guide and including a substrate on which the optical guide has been created by depositing a suitable material on the substrate to create a lower confinement layer, a guide core layer, and an upper confinement layer. The optical guide is designed to be optically connected to an optoelectronic component mounted on the support, in which the support positions the component to ensure its optical alignment with the optical guide. The support includes abutments located at the core level, or defined in a confinement layer in relation to the core layer, to ensure the vertical positioning of the component. The invention also relates to processes for producing the support.

Vertical positioning of an optoelectronic component on a support

This invention concerns a method for optimizing contrast in an image of a sample. This sample (5) comprises a whole number of zones having different reflection or transmittance factors. These zones are illuminated by a light source (7) and the image is obtained at the output of an optical system (4) to be analyzed by a sensor (10) supplying on the outputs recording signals of this image. Contrast optimization consists of determining the characteristics of an optimal fiber to be inserted between the source (7) and the sample (5) to be controlled. Application in particular for the control of in-production integrated circuits.

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Grenoble, France

Gilles Grand