Samsung Electronics Co., Ltd.

Korea Advanced Institute of Science and Technology

Postech Research and Business Development Foundation

Gilho Lee

Sung Jin Kim

Sungsoo Kim

Jae-hyun Kim

Jungin Lee

Won Joon Cho

Seokyeong Jung

Sichen Jin

Dahm Yu

Jonghyun Lim

Seong Hun Jang

Seon-Mi Lee

Ja-Hwan Ku

Sungdug Kim

Inseob Shin

According to various example embodiments, an electronic device includes a microphone configured to receive an audio signal including speech of a user, a processor, and a memory configured to store instructions executable by the processor and personal information of the user, in which the processor is configured to extract a plurality of speech recognition candidates by analyzing a feature of the speech of the user, extract a keyword based on the plurality of speech recognition candidates, search for replacement data, based on the keyword and the personal information, and generate a recognition result corresponding to the speech of the user, based on the replacement data.

Electronic device and speech processing method thereof

The present disclosure provides a spin-orbit torque structure having a high spin Hall angle and low resistance by including a topological material. In addition, the present disclosure provides a spin-orbit torque structure having a low power consumption density by including a topological material. Also, a magnetic memory device including the spin-orbit torque structure is provided.

Spin-orbit torque structure including topological materials and magnetic memory device including the spin-orbit torque structure

Disclosed are a test chamber and a test apparatus having the same. The test chamber includes a test compartment configured to support a plurality of test boards, each being configured to secure a test object. The test chamber applies a test signal to the test object. The test chamber includes an inlet side and a discharge side, and a supply duct vertically extending along a height of the test compartment. The supply duct supplies the inlet side of the test compartment with the test fluid. The test chamber includes a fluid controller to uniformly control a distribution of a test fluid in the supply duct and uniformly supply the test compartment with the test fluid. The disclosed test chamber and test apparatus provide a uniform test temperature and thereby improve a test reliability of a test object such as a semiconductor or semiconductor package.

Test chamber and test apparatus having the same

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Daejeon, South Korea

Gilho Lee