Micron Technology Incorporated

Gianluca Scalisi

Andrea Vigilante

Mauro Luigi Sali

Andrea Pozzato

Andrea Salvioni

A variety of applications can include systems and methods that include a memory system tester having an analyzer coupled to a test flow controller. The test flow controller can be arranged to generate test signals to a memory system with the analyzer arranged to couple to test pads of a package platform for the memory system. The analyzer can provide data to the test flow controller to conduct testing and/or debugging of the memory system, with the data based on real time monitoring of the test pads of the package platform. In various embodiments, the analyzer can provide data feedback to the test flow controller in real time such that the test flow controller can control the flow of test signals to the memory system in real time. Additional apparatus, systems, and methods are disclosed.

Memory system tester using test pad real time monitoring

A testing device comprises test interface circuitry, probe circuitry, and initiate state machine circuitry. The test interface circuitry is configured to receive NAND signaling when operatively coupled to a M-NAND memory device under test and to operate the M-NAND memory device under test to receive memory access requests and to provide status or data at the same rate it receives memory access requests. The probe circuitry is configured to detect memory operations of the memory device under test. The finite state machine circuitry is operatively coupled to the probe circuitry and is configured to advance through multiple circuit states according to the detected memory operations; and log memory events of the memory device under test according to the circuit states.

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Castelverde, Italy

Gianluca Scalisi