Pmc-sierra, Inc.

Advanced Micro Devices Corporation

Ati Technologies Ulc

Gershom Birk

Kenneth William Ferguson

Anwar Kashem

Jurgen Hissen

Ronald L Pettyjohn

David Da Wei Lin

Pouya Najafi Ashtiani

Lisa Ann Desandoli

In accordance with described techniques for read gate training and tracking, a computing device includes a memory system (e.g., dynamic random access memory (DRAM)) that receives a memory read operation which includes a memory clock that correlates to a physical layer (PHY) clock. The computing device includes a PHY that receives a return data signal from the memory system, where the return data signal includes a returned data strobe that is out-of-phase with respect to the PHY clock. The computing device includes training logic that utilizes edge detection to determine an unknown clocking phase of the returned data strobe with respect to the PHY clock. The computing device also includes tracking logic that utilizes the edge detection to detect a signal drift of the delay signal with respect to the returned data strobe and compensate for the drift.

Read gate training and tracking

A test method allows testing of source-synchronous high-speed wide busses on automatic testing equipment for at-speed characterization and production at-speed testing. An integrated circuit that is verified using the method and systems including such an integrated circuit are also disclosed. The invention can enable sampling or testing of signals or test pins that that are running very fast, particular compared to available automatic testing equipment for testing these device. The invention uses data recovery emulation on various types of automated test equipment to capture output data for further, more sophisticated analysis.

Apparatus and method for high speed sampling or testing of data signals using automated testing equipment

A loopback circuit for testing low and high frequency operation of integrated circuit transmitter and receiver components. First and second resistors forming a first branch of the circuit are series-connected between first and second circuit ports. Third and fourth resistors forming a second branch of the circuit are series-connected between third and fourth circuit ports. A DC isolator is connected between the first and second branches. At lower frequencies, the two branches are DC-isolated, enabling ATE-measurement of the transmitter's output drive level independently of the receiver, continuity testing of ESD protection structures, etc. At higher frequencies, the transmitter's output signal is split into three portions, each of which is attenuated by a selected amount. One of the attenuated signal portions is applied to the receiver to test the receiver's sensitivity, independently of possible excess resiliency in the transmitter's output drive level.

High speed I-O loopback testing with low speed DC test capability

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Coquitlam, Canada

Gershom Birk