Samsung Electronics Co., Ltd.

Gershi Koltun

Gal Bitan

Roy Yam

Shai Litvak

Yoel Yaffe

Amit Eisenberg

Ariel Orfaig

Ishay Goldin

In a method for time-of-flight (ToF) based measurement, a scene is illuminated using a ToF light source modulated at a first modulation frequency F. While the light is modulated using F, depths are measured to respective surface points within the scene, where the surface points are represented by a plurality of respective pixels. At least one statistical distribution parameter is computed for the depths. A second modulation frequency Fhigher than Fis determined based on the at least one statistical distribution parameter. The depths are then re-measured using Fto achieve a higher depth accuracy.

Time-of-flight depth measurement using modulation frequency adjustment

A method for processing a digital content includes acquiring content data using a sensor. Compressed reference data is generated from the acquired content data. A hash of the compressed reference data is generated using a hashing function. The generated hash is signed using an encryption function. The acquired content data is transmitted along with the compressed reference data and the signed hash.

Robust selective image, video, and audio content authentication

Growing community of inventors

Givat Ada, Israel

Gershi Koltun