Altasens, Inc.

Teledyne Scientific and Imaging, LLC

Gerrit J Meddeler

Chi Yi Chen

Aristo Yulius

Sheri Douglas

Jon Ellsworth

Providing for operation of high-speed optical sensor equipment at full data path speeds in conjunction with testing equipment operating at a lower speed is described herein. By way of example, a data stream output from optical sensor equipment to testing equipment can be throttled at a serial interface between such equipment. Throttling can involve subdividing a set of pixel data and outputting a subset of the pixel data in a given readout frame. Consecutive outputs of respective subsets of pixel data are initiated with an offset from the previous readout frame. Accordingly, the optical sensor equipment can be operated at full speeds, simulating realistic operational conditions, while slower testing equipment can be utilized to perform data analytics, heuristics, and other quality tests on various portions of the optical sensor equipment.

Data throttling to facilitate full frame readout of an optical sensor for wafer testing

A method of isolating bad pixels on a wafer comprising the steps of determining physical locations of the bad pixels on the wafer, creating a mask based on the physical locations of the bad pixels, imprinting the mask onto the wafer, and hybridizing the wafer onto a readout integrated circuit (ROIC).

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Los Angeles, CA, United States of America

Gerrit J Meddeler