Witec Wissenschaftliche Instrumente Und Technologie Gmbh

Witec Wissenchaftliche Instrumente Und Technologie Gmbh

Gerhard Volswinkler

Peter Spizig

Detlef Sanchen

Othmar Marti

Olaf Hollricher

Joachim Koenen

Jörg Förstner

Wolfram Ibach

Wofram Ibach

Detief Sanchen

A device for imaging the surfaces of a sample having topography with the aid of confocal microscopy, in particular confocal Raman and/or fluorescence microscopy, comprising a first light source, in particular a laser light source for generating excitation radiation, in particular Raman radiation and/or fluorescence radiation and a second light source, wherein the first laser light source emits radiation in a first wavelength range and the second light source emits radiation in a second wavelength range, wherein the first wavelength range and the second wavelength range do not overlap.

Device for imaging a sample surface

The invention relates to an apparatus and a method for imaging surface area of a sample having a surface topography with the aid of confocal microscopy, such as confocal Raman and/or fluorescence microscopy. The apparatus comprises a surface topography sensor that provides values for the surface topography. The surface topography values allow for the surface to be maintained in the confocal plane during scanning.

Apparatus for imaging a sample surface

A microscope, in particular a scanning probe microscope, comprising a programmable logic device.

Scanning probe in pulsed-force mode, digital and in real time

Microscope, in particular a scanning probe microscope, comprising a programmable logic device.

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Laupheim, Germany

Gerhard Volswinkler