Carl Zeiss Microscopy Gmbh

Carl Zeiss Ag

Carl Zeiss Meditec Ag

Carl Zeiss Microimaging Gmbh

Lionix International Bv

Gerhard Krampert

Michael Kempe

Ralf Wolleschensky

Ralf Netz

Ingo Kleppe

Stefan Richter

Daniel Bublitz

Lars Stoppe

Timo Mappes

Michel Stutz

Kai Wicker

Philipp Huebner

Thomas Kalkbrenner

Martin Hacker

Matthias Wald

Veljko Milanovic

Ronald Dekker

Uwe Wolf

Matthias Hillenbrand

Martin Kühner

Johannes Kindt

Edwin Jan Klein

Günter Rudolph

Matthias Langhorst

Robert Pomraenke

Moritz Schmidlin

Wibke Hellmich

Douwe Harmen Geuzebroek

An illumination module () for an optical apparatus comprises a light source unit (), which is configured to selectively emit light along a multiplicity of beam paths () in each case. The illumination module () also comprises a multiplicity of optical elements (-) arranged with lateral offset from one another, wherein each optical element (-) of the multiplicity of optical elements (-) is configured to transform at least one corresponding beam path () of the multiplicity of beam paths.

Segmented optical system for a lighting module for angle-resolved illumination

A method for operating a light microscope with structured illumination includes: providing illumination patterns by means of a structuring device which splits impinging light into at least three coherent beam parts which correspond to a &#x2212;1., 0., and +1. diffraction orders of light; generating different phases of the illumination patterns by setting different phase values for the beam parts with phase shifters; and recording at least one microscope image for each of the illumination patterns and calculating a high resolution image from the microscope images. Phase shifters are provided not only for the beam parts of the &#x2212;1. and +1. diffraction orders but also at least one phase shifter for the beam part of the 0. diffraction order. At least two different phase values &#x3a6;are set with the at least one phase shifter for the 0. diffraction order to provide a plurality of illumination patterns with different phases.

Method for operating a light microscope with structured illumination and optic arrangement

A light microscope comprises: a structuring optical unit comprising a waveguide chip for providing a structured illumination; an input selection device for variably directing light to one of several inputs of the waveguide chip; the waveguide chip further comprising a light guide path following each of the inputs; each light guide path divides into several path divisions; and each path division leads to one output of the wave-guide chip. The outputs of the waveguide chip can be arranged at a pupil plane of the light microscope, and an exit direction of light from the outputs is transverse to a plane defined by the waveguide chip. A method for providing structured illumination light using the light microscope is also described.

Light microscope and method for providing structured illumination light

An optical device includes a sample holder configured to fix an object in the beam path of the optical device, and an illumination module which has a plurality of light sources and configured to illuminate the object from a plurality of illumination directions by operating the light sources, wherein each illumination direction has an assigned luminous field. The optical device also has a filter arranged between the illumination module and the sample holder and configured to expand the assigned luminous field for each illumination direction. As a result, it is possible to reduce artefacts on account of contaminants during the angularly-selective illumination. Techniques of digital artefact reduction are also described. By way of example, the optical device can be a microscope.

Artefact reduction for angularly-selective illumination

Systems and methods for localizing intraocular lens and/or existing refractive index patterns, to laser write-patterns, and to refractive index patterns in order to modify the refractive index by application of femtosecond laser pulses. OCT-based confocal detection and sectional image systems are provided for localization purposes, the systems being particularly suitable for the detection of phase patterns in addition to the localization of the IOL. With respect to laser write-patterns, the modification of existing refractive index patterns in the IOL is carried out by destroying existing structures or supplementing existing refractive index patterns.

Postoperative modification of an intraocular lens

An optical system for producing lithographic structures is disclosed. Also disclosed is a method for determining relative coordinates of a position of a writing field relative to a position of a preview field in such an optical system, and a method for producing lithographic structures using such an optical system.

Optical system for producing lithographic structures

An optical arrangement for being positioned in a beam path of a light microscope, having at least a first and a second optical assembly for providing structured illumination light from incident light. The optical arrangement provides for light to be guided over different beam paths to the various optical assemblies and in the direction of a sample. Electronic control means are provided and designed to illuminate, in each case, a beam path from the different beam paths to different optical assemblies at a point in time, in that at least a first beam combination mirror is provided for guiding light coming from various optical assemblies to a common beam path in the direction of a sample. The first beam combination mirror has reflective areas on which only light from one of the two optical assemblies is incident and has the light-permeable areas of the beam combination mirror in which only light from the other of the optical assemblies is incident. The invention further relates to a light microscope having an optical arrangement according to the invention.

Optical arrangement and light microscope

A beam combiner in a light scanning microscope for combining two illuminating beams that can be independently scanned. A first beam path (B) guides a first illuminating beam () along a first optical axis (OA) and a first optical device (L) bundles the first beam () in an intermediate image plane. A second beam path (B) guides a second illuminating beam () along a second optical axis (OA) that intersects the first optical axis (OA) at a point of intersection (Z) lying in or near the intermediate image plane, and a scanner (S) for deflecting the second illuminating beam () and arranged before the point of intersection (Z) of the optical axes (OA, OA) in the propagation direction of the second illuminating beam (). A coupling-in unit () is arranged at the point of intersection (Z) of the optical axes (OA, OA) and either has a mirror surface () having a passage opening () at the point of incidence of the first optical axis (OA), or is transparent except for a mirror element lying at the point of incidence of the first optical axis (OA), wherein the size of the passage opening () or the mirror element corresponds to the cross-section that the first illuminating beam () at the point of incidence and thus allows the first illuminating beam to pass or reflects the first illuminating beam, wherein the first and second illuminating beams () propagate as a combined illuminating beam () after the coupling-in unit ().

Beam combiner for combining two independently scanned illuminating beams of a light scanning microscope

A luminescence microscopy method includes a sample being used, which comprises a certain substance, wherein the certain substance can be converted repeatedly from a first state, in which it can be excited into emitting luminescence radiation, into a second state, in which it cannot be excited into emitting luminescence radiation. The substance present in the sample can be brought into the first state by irradiating switch radiation. The certain substance can be excited into emitting luminescence radiation by irradiating excitation radiation. The sample emitting luminescence radiation can be displayed. A high-resolution selection of sample regions extending perpendicularly to a sample surface is carried out by irradiating either the switch radiation or the excitation radiation as structured illumination of the sample. A high-resolution selection of the sample surface is carried out by irradiating the switch radiation and/or the excitation radiation as TIRF illumination of the sample.

Luminescence microscopy

In structured illumination microscopy, the multiple recording of images with different phase positions of the structuring requires a high stability in the optical arrangement and sample throughout the entire measuring process. Also, the structuring must be projected into the sample in a highly homogeneous manner. The current invention optimizes recording of individual images in order to achieve the best possible resolution in the result image even in problematic samples. An optimization of this kind can be carried out in different ways, for example, by determining an optimal adjustment for at least one illumination parameter or recording parameter or by pulsed illumination such that an excitation from a triplet state of the fluorescent dye to a higher triplet state is reduced, or by illuminating the sample with depletion light for depopulating a triplet state of the fluorescent dye, which reduces bleaching.

Methods and apparatuses for structured illumination microscopy

A light scanning microscope with an illumination module generates several illumination beams and moves them, in each case as a spot, in a predefined region of a sample to excite sample radiation. A detector module for confocal detection of the sample radiation excited by each spot includes a first detector, an imaging lens system, having an optical axis, for imaging the predefined region along an imaging beam path running from the sample as far as the first detector, and a rotatable diaphragm with several pinholes located in a pinhole plane. The diaphragm, upon rotation, may be located at least partially in the imaging beam path for confocal detection. A second detector may be arranged outside of the imaging beam path. A first beam splitter may be arranged in the imaging beam path between the sample and the diaphragm. The beam splitter deflects sample radiation onto the second detector.

Light scanning microscope and microscopy method

A microscope device which has a diffraction-limited resolution volume, with multiple dye molecules that can be switched between different states, at least one of which is fluorescent. The fluorescence is focused using an objective lens and is imaged onto a spatially resolving detector. In at least one portion of the sample, the dye molecules have a distribution density that is greater than the inverse of the diffraction-limited resolution volume. One or more light sources are provided for emitting a switching radiation in order to switch a first subset of the dye molecules in the sample, and for emitting an excitation radiation in order to excite the first subset of dye molecules. A phase mask which generates a light distribution having an at least partially limited local minimum radiation on the detector plane is provided in the beam path, preferably in the detection beam path.

Apparatus, especially microscope, for the analysis of samples

A method for generating an image of a sample by a microscopy method including varying local resolution, wherein at least two of the following microscopy methods are combined: laser scanning microscopy, a microscopy method wherein the sample is excited to luminescence by structured line or wide area illumination, and a first microscopy image is generated from the images thus obtained, having increased local resolution greater than the optical resolution of the image, a further microscopy method according to the PAL principle, by which a second microscopy image is generated, indicating geometric locations of marker molecules emitting luminescent radiation at an increased local resolution relative to the optical resolution, and a further microscopy method, wherein the sample is marked using marking molecules suitable for the STED, ESA, or RESOLFT technique, and a third microscopy image is generated of STED, ESA, or RESOLFT, wherein the obtained images are superimposed.

Combination microscopy

An SS OCT interferometry device for measuring a sample, in particular from an eye. The device interferometrically generates a measuring signal and from the signal a depth-resolved contrast signal of the sample by spectral tuning of the central wavelength of the measurement radiation of a measuring signal, and has a control unit for this purpose. The device includes a sample motion detector, which provides a motion signal indicating movement of or in the sample, the control unit uses the motion signal to correct the measuring signal with respect to measuring errors that are caused by a movement of or in the sample before or during the generation of the depth-resolved contrast signal.

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Jena, Germany

Gerhard Krampert