Micro-Epsilon Messtechnik Gmbh & Co. Kg

Gerhard Kirschner

Daniel Schweizer

Herbert Fuellmeier

Achim Sonntag

Franz Hochwimmer

With regard to a reliable measurement of the thickness of an object () even in an environment with high temperatures, a device () is provided for determining the thickness of an object (), more particularly a strip-like or flat object (), preferably for use in a hot rolling process, having a frame () with at least one leg (), the at least one leg () having a sensor () for the contactless measuring of the distance to the object (), which device is characterised in that the at least one leg () has a structure consisting of a plurality of layers in order to reduce the temperature effect on the frame () and/or on the sensor ().

Device for determining the thickness of an object

The invention relates to a device serving for the combined measurement of the width and thickness of a flat object, in particular a plate, a belt, or a web. The device comprises a measurement apparatus which has at least one contactless sensor, which is for width measurement on the object and which is movable crosswise to the longitudinal direction or conveying direction of the object. According to the invention, on the opposite side of the object, there is a second sensor opposite the first sensor which, together with the first sensor, serves for thickness measurement on the object, wherein the two sensors can travel above and below the object, that is, on opposite sides of the object.

Device and method for measuring the width and thickness of a flat object

An apparatus for measuring the thickness of a measurement object, preferably a measurement object in the form of a web or piece goods, in a measuring gap, with a measuring mechanism which is fitted to a machine frame, wherein the measuring mechanism for measuring the thickness comprises one or more travel measurement sensor(s) aimed at the measurement object, is characterized in that a compensation sensor which is coupled to a travel measurement sensor measures the distance to a reference rule in order to detect and compensate for a change in the measuring gap, in that the reference rule is in the form of a side of a frame-shaped reference device integrated in the measuring mechanism, and in that the reference device is configured in such a manner that the distance between the reference rule and that side of the reference device which is opposite the reference rule is known during the thickness measurement. A corresponding method for measuring the thickness is also stated.

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Passau, Germany

Gerhard Kirschner