International Business Machines Corporation

Gerhard Elsner

Johann Greschner

Holger Hinkel

Frank Druschke

Roland R Stoehr

Upali Bandara

Marian Briska

Johann W Bartha

Werner Steiner

Werner Zapka

Harald W Gruber

Volker Heinrich

Artur Lang

Erwin Prinz

Rainer Kratzert

Roland Diemer

Reinhold Braun

Wolfgang Beck

Wolfgang Schmid

Arved Brunsch

An ion generator for the generation of a plasma is assembled from module subassemblies. The first subassembly includes a dielectric plate 1, on the first surface 1a of which are located a large number of first electrodes 3, and the second surface 1b of which is coated with a structured conductive layer 2. The second subassembly includes an aperatured spacer plate with a large number of dielectric spacers with a second electrode 5 on the side facing away from the dielectric plate 1. In joining the subassemblies together, the aperatured spacer plate is connected to the dielectric plate 1 at its first surface 1a in such a way that cavities 6 for accommodating plasma are formed by the first electrodes 3, parts of the first surface 1a of the dielectric plate 1 and the spacers 4 with the second electrodes 5. The first set of electrodes 3 shield the points where the subassemblies are bonded together from plasma in the cavities.

Ion generator for ionographic print heads

Production of a support element module for embedding into smart cards or

A contact probe arrangement for electrical functional testing, including a first stack of perforated plates, a second stack of perforated plates and a plurality of contact probes. The probes are in contact with the second stack of perforated plates, and in communication with the first stack, the probes are arranged and dimensioned such that the probes are capable of lateral buckling and capable of being guided through the first stack. The contact probe arrangement also includes a test card, a counterholding piece attached to the test card, and a pressure plate, the pressure plate movably connected to the test card. The first perforated plate is connected to the second perforated plate such that the first perforated plate is capable of movement toward and away from the second perforated plate and the second perforated plate is connected to the first perforated plate such that the second perforated plate is capable of movement toward and away from the first perforated plate.

Contact probe arrangement for functional electrical testing

Directly contactable disk for vertical magnetic data storage

The invention relates to an adhesive bond 1 for a plurality of densely packed elements 4a, 4b, 4c guided into a plate pack 3. At the plate surface 2 with the adhesive bond 1 the guidance holes 5a are made larger than the guidance holes 5b in the remainder of the plate pack (3) and the adhesive bond is effected by means of a highly viscous adhesive. Because of the larger opening 5a, an adhesive reservoir 10 is formed at the plate surface 2. This makes it possible to use high viscosity adhesives. The geometric features and the use of a highly viscous adhesive make it possible to manufacture durable and heat-resistant adhesive bonds for elements such as wires, glass fibers or micromechanical components.

Adhesive bond for densely ordered elements

A method of automatically forming identically positioned alignment marks on the front side and the back side of a silicon wafer especially prepared for use in silicon micromechanical technology. The front side and the back side of the silicon wafer are coated with an insulating layer. High-energy heavy ions are directed onto the front side insulating layer. The heavy ions penetrate the front side insulating layer, the wafer, and the back side insulating layer, thus forming single disturbed crystal lattice nuclear tracks in both insulating layers, with the wafer remaining undisturbed. The nuclear tracks in both insulating layers are etched so that corresponding identically positioned pores are opened. These pores are used as alignment marks for individual further method steps.

Method of forming identically positioned alignment marks on opposite

Method for measuring the properties of a slider/disk interface in a magnetic disk storage apparatus by measuring a triboelectric current flowing between disk and slider. Rotational speed is adjusted between 100 and 500 rpm so as to obtain a frictional contact between disk and slider. The shape of the tribo current curve obtained during the measuring time interval is analyzed. An early maximum of the tribo current amplitude and a subsequent continual decay indicates a good slider/disk interface and a long lifetime.

System for testing magnetic head/disk interfaces

A magnetic recording disk comprises a magnetic layer consisting of a binder and magnetic particles, a silicon substrate and abrasion-resistant material formed on the silicon substrate. The abrasion-resistant material is in the form of elevations which protrude from the silicon substrate and whose surface is coplanar with the surface of the magnetic layer. The abrasion-resistant elevations are formed on the substrate in a predetermined uniform distribution either after the surface of the substrate has been blanket doped and/or covered with a layer comprising aluminum as a main component, by tempering and optionally oxidizing; or after the surface of the substrate has been selectively doped, by etching off the undoped regions of the surface of the substrate.

Abrasion-resistant magnetic recording disk

Growing community of inventors

Kaarst, Germany

Gerhard Elsner