International Business Machines Corporation

Other

Sony Corporation

Ernst Leitz Wetzlar Gmbh

3d-shape Gmbh

The University of Erlangen

Gerd Haeusler

Walter Jaerisch

Andreas Maier

Guenter Makosch

Ralf Lampalzer

Tobias Geimer

Markus Schreiter

Thomas Kaestner

Florian Willomitzer

Aleksandra Milczarek

Markus Knauer

A main module for a modular system for self-examination of an eye is provided. The main module has an interface for coupling with at least one other module of the modular system and a processor. The processor is configured to perform at least one eye test algorithm by controlling the at least one other module.

Main module, system and method for self-examination of a user's eye

The invention relates to a method and an apparatus for high-resolution deflectometric determination of the local slope and of the three-dimensional shape of an object (). The apparatus comprises a microscopic imaging system () having a numerical aperture (sin u), a focus plane () and a receiving unit (); an illuminating system () having a grating generator () that preferably generates a sine grating (); and a control and evaluating unit. The object () is located in the object space of the imaging system. The illuminating system (), which is fashioned as an illuminating system for reflected-light objects or for transmitted-light objects, generates a series of grating images (), which are projected as virtual images into the object space a distance d from the focus plane of the microscopic imaging system. The imaging system images onto a receiving unit, as a modulated image, the object and simultaneously the grating image reflected in the object or the transmitted grating image. The local slope components of the object surface are determined from the series of modulated images with the aid of the evaluating unit.

Method and microscopy device for the deflectometric detection of local gradients and the three-dimensional shape of an object

A method teaches how to measure&#x2014;even strongly curved&#x2014;specular surfaces with an apparatus that measures a shape as well as local surface normals absolutely. This is achieved by the observation and evaluation of patterns that are reflected at the surface. The reflected patterns are observed from different directions. The evaluation is done by termination of those locations in space, where the surface normals that are observed from different directions, have at least deviations against each other.

Method and apparatus for determining the shape and the local surface normals of specular surfaces

Optical imaging systems are used for making microstructures, and have to be very precise. In order to test these imaging systems, a new method, and a device for carrying out this method, are described in which two interferograms are made and compared. In a first step, an interferogram of an original pattern is made, followed by a second step in which an interferogram of a copy of the original pattern is produced using the identical conditions used to form the first interferogram. The pattern copy is made in the imaging system to be tested. In a third step, the two interferograms are compared with one another to provide a measure of the accuracy of the imaging system. This technique can be used for testing imaging systems which produce only a mirror image.

Method and device for testing optical imaging systems

A method for testing optical imaging systems by the use of moire stripes, wherein two copies of an optical grating are made and simultaneously illuminated to produce a moire pattern which is a measure of the distortion of the imaging system. In a first step an original grating is transferred by a light beam as a contact copy onto a substrate. In a second step, the imaging system to be tested copies the original grating for a second time onto the substrate, except that the second grating copy is rotated slightly with respect to the first grating copy. The points of intersection of the two superimposed gratings produce moire stripes when illuminated, the positions of the stripes being calculated precisely with the assumption that ideal gratings were used. If the imaging system to be tested shows distortions, the position of the moire stripes that are observed will not correspond to these calculated positions. The deviation therefrom is a measure of the imaging system errors.

Method of moire-metrical testing of optical imaging systems

A method of and apparatus for increasing the range of depth of focus when optically imaging three dimensional objects having different depth ranges corresponding to desired image levels wherein the object is focused through at a plurality of levels to produce a plurality of images. At each level, the image produced has sharp details and unfocused details. Each image is filtered with a high pass filter to suppress unfocused details and to pass sharp details. The images are then summed to produce a composite image containing only the sharp details passed by the filtering step. If desired, the filter may be selectively by-passed in order to sum unfiltered images. By utilizing the method of an apparatus for practicing the instant invention more meaningful visual displays of three-dimensional objects are obtained.

Growing community of inventors

Erlangen, Germany

Gerd Haeusler