Analog Devices International Unlimited Company

Analog Devices,inc.

Gerard E Taylor

Wenhua William Yang

Corey Petersen

Hajime Shibata

Allen R Barlow

Jialin Zhao

Matthew Louis Courcy

Kaustubh Pradeepkumar Mundhada

Satishchandra G Rao

Vinoth Kumar

Madhusudan Rathi

Delay calibration for digital signal chains of SFCW systems is disclosed. An example calibration method includes receiving a burst with a test pulse, the burst having a duration of L clock cycles; receiving a trigger indicative of a time when the burst was transmitted; generating a digital signal indicative of the received burst; for each of L clock cycles, computing a moving average of a subset of digital samples and an amplitude for each average; identifying one moving average for which the computed amplitude is closest to an expected amplitude; identifying the clock cycle of the identified moving average; and updating at least one delay to be applied in digital signal processing of received bursts based on a difference between the trigger and the identified clock cycle. The delay may be used for selecting digital samples of the received signal that contain valid data for performing further data processing.

Delay calibration for a stepped frequency continuous wave digital signal chain

VCO ADCs consume relatively little power and require less area than other ADC architectures. However, when a VCO ADC is implemented by itself, the VCO ADC can have limited bandwidth and performance. To address these issues, the VCO ADC is implemented as a back end stage in a VCO-based continuous-time (CT) pipelined ADC, where the VCO-based CT pipelined ADC has a CT residue generation front end. Optionally, the VCO ADC back end has phase interpolation to improve its bandwidth. The pipelined architecture dramatically improves the performance of the VCO ADC back end, and the overall VCO-based CT pipelined ADC is simpler than a traditional continuous-time pipelined ADC.

VCO-based continuous-time pipelined ADC

A DAC has a plurality DAC cells, and timing mismatch among the DAC cells can introduce errors in an output of a DAC. An efficient technique can be implemented to extract the timing error of a DAC cell. The technique involves a mixer to mix the timing error to DC (DC stands for direct current, where signal frequency is zero) and a VCO ADC to observe the output of the DAC cell to measure and extract the timing error. A first measurement is made using a first quadrature phase signal and a second measurement is made using a second quadrature phase signal. A difference between the first measurement and the second measurement yields the timing error of the DAC cell. Advantageously, the mixer can be integrated within a voltage-to-current converter of the VCO ADC. The timing error can be corrected in the digital domain or analog domain.

DAC calibration using VCO ADC

Apparatus and methods for ultrasound probes are provided. In certain implementations, a receive switch for an ultrasound probe includes a first field effect transistor (FET) and a second FET electrically connected in series between a first terminal and a second terminal with the FETs' sources connected to one another. The receive switch includes a positive threshold detection and control circuit for turning off the receive switch when a voltage of the first terminal is greater than a positive threshold voltage, and a negative threshold detection and control circuit for turning off the receive switch when the first terminal's voltage is less than a negative threshold voltage. The receive switch further includes a gate bias circuit that can bias the gates of the first and second FETs so as to turn on the receive switch when no positive or negative high voltage conditions are detected on the first terminal.

Apparatus and methods for ultrasound probes

Apparatus and methods for ultrasound transmit switching are provided. In certain implementations, a transmit switch includes a bias polarity control circuit, a bias circuit, a first high voltage field effect transistor (HVFET), and a second HVFET. The sources of the first and second HVFETs are connected to one another at a source node, the gates of the first and second HVFETs are connected to one another at a gate node, and the drains of the first and second HVFETs are connected to an input terminal and an output terminal, respectively. The bias circuit and the bias polarity control circuit are each electrically connected between the source node and the gate node. The bias polarity control circuit can turn on or off the HVFETs by controlling a polarity of a bias voltage across the bias circuit, such as by controlling a direction of current flow through the bias circuit.

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Laguna Niguel, CA, United States of America

Gerard E Taylor