Agilent Technologies, Inc.

Gerald R Kinsley

Jimmie Doyle Felps

Michael R Fender

Brian L Richardson

Helen K Muterspaugh

A system and method for application control in measurement devices is disclosed. The method includes installing a new application using the device's graphical user interface, extending the device's menu system for the new application, launching the new application using the device's extended menu system, and controlling the device using the new application through a remote control mechanism of the device. A system of application control in a measurement device is also disclosed.

System and method for application control in measurement devices

An electrical probe is provided for use with an electrical instrument, such as an oscilloscope. The probe includes a probe body, a sensing element affixed to the probe body for sensing an electrical parameter and a storage device containing probe information that uniquely identifies the probe. The probe information is electronically transferred from the storage device to the electrical instrument when the probe is connected to the electrical instrument. The electrical instrument stores calibration information that is associated with the probe. The electrical instrument uses the probe information received from the storage device in the probe to access the associated calibration information. The accessed calibration information is used to calibrate measurements made with the probe.

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Colorado Springs, CO, United States of America

Gerald R Kinsley