Micron Technology Incorporated

Intel Corporation

Ovonyx Memory Technology, LLC

Gerald J Barkley

Nicholas T Hendrickson

Daniele Vimercati

Poorna Kale

Pierguido Garofalo

Kerry Dean Tedrow

Andrea Martinelli

Efrem Bolandrina

Sunil Shetty

Fabio Pellizzer

Andrea Redaelli

Agostino Pirovano

Jun Xu

John Rudelic

Mase J Taub

Augusto Benvenuti

Daniel Chu

Matthew Goldman

Alec W Smidt

Greg Komoto

Bharat V Chauhan

Xinwei Guo

Balaji Sivakumar

An apparatus, such as a nonvolatile solid-state memory device, may, in some implementations, include access line bias circuitry to set a bias level associated with a deselected access line(s) of a memory core in response to mode information. In one approach, access line bias circuitry may use linear down regulation to change a voltage level on deselected access lines of a memory core. A memory access device, such as a host processor, may be provided that is capable of dynamically setting a mode of operation of a memory core of a memory device in order to manage power consumption of the memory. Other apparatuses and methods are also provided.

Apparatus and methods to provide power management for memory devices

An apparatus, such as a nonvolatile solid-state memory device, may, in some implementations, include access line bias circuitry to set a bias level associated with a deselected access line(s) of a memory core in response to mode information. In one approach, access line bias circuitry may use linear down regulation to change a voltage level on deselected access lines of a memory core. A memory access device, such as a host processor, may be provided that is capable of dynamically setting a mode of operation of a memory core of a memory device in order to manage power consumption of the memory. Other apparatuses are also provided.

Methods and systems are provided that may include a nonvolatile memory to store information, where the nonvolatile memory is associated with a configuration register to indicate a write speed setting for at least one write operation to the nonvolatile memory. A circuit may supply current to achieve an indicated write speed setting for the at least one write operation to the nonvolatile memory.

Method and apparatus for configuring write performance for electrically writable memory devices

A plurality of block configurations may be employed for read while write operations. In one apparatus example, a plurality of block configurations may be employed. Block configurations may include an arrangement of similarly doped semiconductor switches. Block configurations may select a respective tile of a memory array, a particular memory cell of the respective tile, and select a memory operation to apply to the particular memory cell. Immediately adjacent block configurations within a particular slice of the memory array may be substantially mirrored and immediately adjacent block configurations in separate immediately adjacent slices of the memory array may be substantially similar. Similarly doped diffusion regions for similarly doped semiconductor switches in substantially mirrored block configurations may be arranged to electrically share a common potential signal value level. Other apparatus and methods are also disclosed.

Apparatus and methods to perform read-while write (RWW) operations

Subject matter disclosed herein relates to methods and apparatus, such as memory devices and systems including such memory devices. In one apparatus example, a plurality of block configurations may be employed. Block configurations may include an arrangement of similarly doped semiconductor switches. Block configurations may select a respective tile of a memory array, a particular memory cell of the respective tile, and select a memory operation to apply to the particular memory cell. Immediately adjacent block configurations within a particular slice of the memory array may be substantially mirrored and immediately adjacent block configurations in separate immediately adjacent slices of the memory array may be substantially similar. Similarly doped diffusion regions for similarly doped semiconductor switches in substantially mirrored block configurations may be arranged to electrically share a common potential signal value level. Other apparatus and methods are also disclosed.

A memory device includes wordline decoder circuits that share components between adjacent memory blocks. The wordline decoder circuits include multiple levels, where at least one level is split, driving half of the wordlines in one adjacent memory block and driving half of the wordlines in another adjacent memory block. Memory blocks have every other wordline coupled to one adjacent decoder circuit, and the remaining wordlines coupled to another adjacent decoder circuit.

Memory apparatus and system with shared wordline decoder

Subject matter disclosed herein relates to a memory device and method of programming same. In some embodiments, a memory device can be programmed by partitioning information into a plurality of chunks. Partitioning can be performed by determining a pattern of logic ones and zeroes, and setting a size of an information chunk based on the pattern of logic ones and zeroes.

Staggered programming for resistive memories

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Folsom, CA, United States of America

Gerald J Barkley