Electro Scientific Industries, Inc.

Gerald F Boe

Douglas John Garcia

Nick A Tubbs

William J Saunders

Jeff Fish

A miniature component carrier includes a thin, resilient mask through which are formed multiple spaced-apart apertures each of which is sized and shaped to compliantly receive and hold a miniature component in a controlled orientation during termination processing such that the side margins of the aperture primarily contact and grip the corner regions of the miniature component. At least some of the apertures have side margins that form rhomboidal or elliptical apertures. The shape and size of the multiple spaced-apart apertures confine within an operational tolerance contact between the side margins of the aperture and the side or end wall surfaces of the electronic component. This reduces mechanical damage to the side and end wall surfaces that results from their contact with the side margins during receipt and gripping of the miniature component in the aperture.

Configurations of apertures in a miniature electronic component carrier mask

Method of preventing damage to miniature electronic components held by a component carrier

A gap set device for an electronic component handler is provided. The electronic component handler includes a test module operative to load, test and unload electronic components. The electronic components are received in test pockets provided on a test plate. The test pockets include at least one corner relief to improve loading efficiency.

Test plate for electronic handler

An improved electronic component handler and associated improved test plate are shown. A guide on the test plate is used to intersect the testing apertures to eliminate misalignment of the component loading frame and the aperture to ensure easy insertion of components into the test apertures.

Electronic component handler test plate

A component handler includes an improved test seat having a shape that ensures that an electronic component seated in the test seat is in an appropriate orientation for parametric testing. The test seat has a base surface and first and second opposed seat side surfaces separated by generally increasing distances from a narrower notch end to a wider notch end. There is an opening at the narrower notch end. An electronic component is seated within this test seat such that the first and second side surfaces of the electronic component rest against the first and second seat side surfaces. A side surface side margin on which is formed a wraparound electrode is exposed by an opening at the narrower notch end and a second side surface side margin on which is formed a second wraparound electrode is exposed by an opening at the wider notch end.

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Newberg, OR, United States of America

Gerald F Boe