Freescale Semiconductor,inc.

George W Wood

Amol V Bhinge

Hillel Miller

An approach is provided that receives a file request and maintains a set of file versions of the requested file on a network-accessible storage media. The file versions are retrieved from the network accessible storage media along with expected hash values corresponding to each of the file versions. The retrieved file versions are stored in a second nonvolatile storage media, such as a local nonvolatile storage. File versions are selected from newest to oldest. When a file version is selected, a hash value is computed for the file and this hash value is compared to the expected hash value that corresponds to the selected file version. The first (newest) file version with a hash value that matches the expected hash value is selected and returned to the requestor.

Network file update mechanism with integrity assurance

A method, computer program product, and data processing system that controls test packets that are sent to a coordinating computer system is provided. A node computer system runs a test case that results in one or more test result packets. Control data structures are received from one or more coordinating computer systems. The resulting test result packets are compared to the one or more received data structures. The comparison reveals whether one or more of the test result packets include results requested by the coordinating computer systems. Test result packets are selected when the comparison reveals that the selected test result packets include results requested by the coordinating computer systems. Selected test result packets are sent to one of the coordinating computer systems and unselected test result packets are discarded by the node.

Improving test pattern coverage through parallel discard, flow control, and quality metrics

A method, computer program product, and data processing system for minimizing the number of test sequences needed to achieve a desired level of coverage of events in testing a semiconductor design is disclosed. Test patterns are randomly generated by one or more 'frontend' computers. Results from applying these patterns to the design under test are transmitted to a 'backend' computer for processing. A determination is made as to which test sequences trigger events not already triggered by previously-considered test sequences. An autograde data structure is generated which further reduces the number of test sequences. A preferred embodiment of the present invention may be used to reduce the number of test sequences required, but may also be used to provide test engineers a basis for devising manually-created test sequences to test related events.

Method and apparatus for performing test pattern autograding

A method, computer program product, and data processing system for determining test sequences' coverage of events in testing a semiconductor design are disclosed. Test patterns are randomly generated by one or more 'frontend' computers. Results from applying these patterns to the design under test are transmitted to a 'backend' computer in the form of an ordered dictionary of events and bitmap and/or countmap data structures. A &#x201c;bitmap&#x201d; data structure encodes Boolean information regarding whether or not a given event was covered by a particular test sequence. A &#x201c;countmap&#x201d; data structure includes frequency information indicating how many times a given event was triggered by a particular test sequence. The backend computer combines results from each test sequence in a cumulative fashion to measure the overall coverage of the set of test sequences.

Growing community of inventors

Austin, TX, United States of America

George W Wood