Marconi Instruments Limited

George Hjipieris

Christopher M Potter

Paul Bunyan

Andrew G Bullock

Timothy J Pegg

Garry Thorp

Guy Purchon

Martin Cryan

Alan M Elston

An instrument which provides a measurement of the frequency and power of a microwave signal supplied to an input port of the instrument. The instrument includes: a resistive device which divides the microwave signal supplied into first and second microwave divisions thereof; a frequency counter which measures the frequency of the first microwave division, thereby providing the measurement of the frequency of the microwave signal supplied; and a power sensor and power meter combination which measures the power of the second microwave division. The power sensor and meter combination makes a calibration correction dependent on the frequency measured by the frequency counter to its power measurement, thereby providing the measurement of the power of the microwave signal supplied.

Instrument for measuring the frequency and power of a microwave signal

Disclosed is a Device Under Test (DUT) fault detection and location circuit. A first circuit port is connected to the DUT for fault detection and location. A signal source for generating a series of signals across the operating frequency range of the DUT is connected to a second circuit port. A divider divides each signal generated by the source so as to provide first and second fractions of the signal, the second fraction passing to the device under test. A fault detection section provides a DUT fault detection voltage for each respective frequency. The circuit also has a branch including an impedance section and a fault location section. The branch receives the first fraction, and the fault location section provides a DUT fault location voltage for each respective frequency. The fault detection section is connected between the impedance section and the DUT such that each fault detection voltage it provides indicates whether a predetermined relationship exists between the impedance of the impedance section and the impedance presented by the DUT. In addition to serving as a reference impedance for fault detection, the impedance section serves to match the fault location section which performs fault location measurements to the impedance presented to the fault location section by the divider.

Single device under test (DUT) port common reference/matching impedance

A microwave synthesiser comprising: a plurality of oscillator sources (1, 13, 3, 15, 5, 17, 7), each for generating signals over a range of frequencies, said ranges of frequencies together extending over a total range of frequencies generated; phase locked loops (19, 31, 83, 37, 38, 41, 81) for phase-locking any selected one of said oscillator sources (1, 13, 3, 15, 5, 17, 7) so that it generates signals of a frequency at which it is set; a single low harmonic modulator (21) for modulating the signals generated by the selected one of said oscillator sources (1, 13, 3, 15, 5, 17, 7), the modulated signals passing to an output (27) of said synthesiser; and at said output (27) elements (25, 29) for detecting the power of the signals at said output (27), the modulation by said single low harmonic modulator (21) being controlled in dependence on the detected power thereby to control the power of the signals at said output (27).

Microwave frequency synthesizer having selectable oscillator sources and

An attenuator incorporates a matched circuit which directs a portion of the input power to a power detector (25). In response to the power level reaching a threshold value an actutor breaks the circuit through the attenuator to provide reverse power protection.

Attenuator switchably coupled to transmission path and means for

In many microwave applications poor repeatability of results is often caused by differences in the quality of the coaxial connections. This invention overcomes the problem by ensuring more uniform connection by providing two mechanical connecting means radially separated from each other and coaxial with a central conducting means being connected, thus ensuring precise alignment of the two conductors.

Connector

A test arrangement for testing high frequency electrical devices consisting of two 6-port reflectometers which are both connected to a device under test. In order to calibrate the test arrangement, an arbitrary termination generator is connected to each test port while its test signal represents a reflectivity coefficient of greater than unity, so that it simulates active devices as well as passive ones.

Six-port reflectometer test arrangement and method including calibration

A test arrangement for testing high frequency electrical devices consists of two 6-port reflectometers which are both connected to a device under test. As well as being applied to the device under test, a reference sample of an excitation signal is routed to both 6-port reflectometers simultaneously. The test arrangement is capable of very wide operation and is able to fully characterize the electrical properties of a device.

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Hitchin, United Kingdom

George Hjipieris