Semiconductor Insights Inc.

Symagery Microsystems Inc.

Harusaki Technologies, LLC

Pleora Technologies Inc.

George Chamberlain

John Scott-Thomas

Paul Hua

Larry Lam

Ghassan Naim

Alexei Ioudovski

Alain Rivard

Eric Boisvert

Ron McDonald

Alexi Ioudovski

John-Scott Thomas

Scott-Thomas John

Alexei Ioudovsky

Tom Little

John Scott Thomas

Ghassam Naim

Many electrical sensing devices include an array of transducer elements for converting external stimuli to electrical indications. Novel technologies to realize improvements in low power consumption, low noise, and analog output path which occupies minimal die area while maintaining certain data rates are disclosed. A two stage pipeline architecture of the invention in the analog output path maintains fast pixel rates with minimal ADC (analog digital converter) arrangement. A novel power supply and the use of differential amplifiers in connection with a black signal level as a reference voltage are also described.

Electrical sensing apparatus and method utilizing an array of transducer elements

This invention is directed to a method and apparatus for providing low, predictable latencies in processing IP packets. The apparatus provides a specialized microprocessor or hardwired circuitry to process IP packets for video communications and control of the video source without an operating system. The method relates to operation of a microprocessor which is suitably arranged to carry out the steps of the method. The method includes details of operation of the specialized microprocessor.

Massively reduced instruction set processor

A method and apparatus for testing an image sensor array such as a C-MOS imager which has sensing circuits arranged in rows and columns and wherein the sensing circuits include photosensitive devices is described. A reset voltage is applied to the photosensitive device in each of the sensor circuits such that at least adjacent circuits are reset to different voltage levels. The voltage on each photosensitive device is detected and compared to an expected level to determine if and where any faults may exist in the sensing circuits or lines in the array. A different reset voltage may be applied to each of the sensor circuits, however in one embodiment, a supply with only two voltage levels may be used. One voltage level is applied to every second column to provide a supply voltage to the photosensitive devices and to every second row to generate a reset enable signal for the photosensitive devices. The second voltage level is applied to the remaining columns and rows resulting in different reset voltage levels on adjacent sensing circuits.

Method and apparatus for testing image sensing circuit arrays

A method for extracting design information from a semiconductor integrated circuit (IC) or at least a portion thereof comprising the steps of: (a) imaging at least a portion of one or more IC layers to obtain stored images of said portions of the IC; (b) using manual or automatic registration techniques to mosaic images; (c) using an IC layout package possessing a feature of allowing images to be displayed and moved and polygons to be created to allow the recreation of the IC layout in the form of polygons; (d) exporting or storing of a polygon database in a standard IC layout format; (e) creating a table of transistor connections (netlist); (f) organizing circuit netlist into functional blocks of increasing complexity; and (g) generating a schematic diagram.

Computer-assisted design analysis method for extracting device and interconnect information

A method for analyzing an integrated circuit (IC). At least a portion of a layer of the IC is scanned using high magnification, to obtain images of the IC. The images are registered to create a mosaicked image. An IC layout database is created in the form of a set of polygons from the mosaicked image, where the step of creating the IC layout database is performed after, or pipelined with, the registering step. The process is repeated for plural IC layers, as necessary. Polygon sets from each layer are vertically registered into alignment with minimal distortion. A netlist or schematic diagram is generated to represent the scanned IC portion based on the registered set(s) of polygons.

Method to extract circuit information

A method of analyzing at least a portion of an integrated circuit (IC) comprised of the steps of automatically: (a) scanning at least a portion of a layer of an integrated circuit using high magnification to provide first digital signals representing pixel amplitudes, (b) extracting features of interest from the first digital signals to provide second digital signals representing values of groups of pixels defining the features of interest, (c) modifying the second digital signals representing adjacent features of interest from step (b) so as to mosaic the features of interest and providing third signals representing a seamless representation of the layer, (d) repeating steps (a), (b) and (c) for other layers of the integrated circuit, whereby plural third signals representing plural ones of the layers are provided, (e) registering the plural third signals relative to each other so as to represent vertical alignment of the layers by determining features of interest representative of IC mutual interconnection locations between layers, and using the locations as control points for the registering, and establishing an integrated circuit layout database therefrom, (f) generating a netlist from data signals defining the cells, and (g) generating a schematic diagram of a circuit contained in the integrated circuit from the netlist.

Automated design analysis system for generating circuit schematics from

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Kanata, Canada

George Chamberlain