Infineon Technologies Ag

Infineon Technologies Austria Ag

Georg Pelz

Thomas Nirmaier

Michael Lenz

Manuel Harrant

Matthias Kunze

Jerome Kirscher

Cristian Mihai Boianceanu

Thomas Beer

Monica Rafaila

Norbert Elbel

An electronic system includes a pixelated light source having a plurality of individually controllable pixels, a controller operable to control the pixelated light source, a photosensor configured to detect light signals emitted from the pixelated light source, and an analysis unit configured to recognize objects with different properties that pass in range of the pixelated light source and the photosensor, based on the light signals detected by the photosensor. Corresponding object recognition and material analysis methods are also described.

Method and device for object recognition and analysis

A device for thermal protection is described. The device may be configured to determine current temperature information for a set of light emitting diodes (LEDs), receive an indication of a requested light pattern for the set of LEDs, and determine predicted temperature information for the set of LEDs based on the current temperature information and the requested light pattern. In this example, the device is further configured to operate the set of LEDs at a modified light pattern that is different from the requested light pattern in response to determining that the predicted temperature information indicates that the set of LEDs operates at an unsafe temperature when operating at the requested light pattern.

Thermal protection for light emitting devices

A load driver circuit for driving an electric or electronic load is described. In accordance with one example, a circuit includes a power supply circuit operably coupled to the load and configured to provide a load current operably passing through the load in accordance with at least one control signal. A measurement circuit is coupled to the power supply circuit or the load and configured to measure, during operation of the load, at least one operation parameter of the load. A signal processing circuit receives the at least one operation parameter measured by the measurement circuit and is configured to estimate, based on the at least one operation parameter and a parametric model that characterizes the load, one or more model parameters of the parametric model.

Load driver circuit including load model parameter estimation

Methods and apparatuses related to the generation of test stimuli are described. In some embodiments, a finite state machine is generated based on a mission profile, and test stimuli are generated based on the mission profile.

Generation of test stimuli

A system is described that includes a power bus, a power source configured to supply power to the power bus, and a device receiving at least some of the power supplied by the power source. The device is configured to determine a quality level of the power received from the power bus, and perform an operation of the device according to the quality level of the power. The quality level of the power may be determined on an output from a wavelet transform. For example, the device may apply a wavelet transform to a function based on the power, isolate disturbances from the output of the wavelet transform, and based on the disturbances, determine the quality level of the power.

Dynamically adapting device operations to handle changes in power quality

A method for determining test sets of operating parameter values for an electronic component, the method including: determining a first set of intermediate sets, each intermediate set containing a combination of a first number of operating parameters of the electronic component; determining a second set of reference sets, wherein the second set contains a union of sets, each set comprising all possible combinations of parameter values for the parameters of a respective intermediate set; selecting a third set with a second number of test sets out of a set of predefined sets, wherein each predefined set comprises a different combination of the parameter values for all parameters from the predefined parameter set, such that the second set is a subset of a union of a number of sets, each set comprising all possible combinations of the first number of parameter values for all parameters of a respective test set.

Method and device for determining test sets of operating parameter values for an electronic component

An embodiment of the invention relates to an apparatus including a power semiconductor device and a processor coupled thereto. The processor is configured to provide a control signal to the power semiconductor device to regulate an output characteristic of the apparatus. The processor models an internal characteristic of the power semiconductor device and alters the control signal if the modeled internal characteristic crosses a threshold value. In an exemplary embodiment, the internal characteristic is a channel temperature of a MOSFET. A sensor such as a thermistor is coupled to or included within the processor to sense a parameter separate from the power semiconductor device, such as a processor temperature, and the processor is configured to adapt the modeled internal characteristic to the sensed parameter.

Growing community of inventors

Ebersberg, Germany

Georg Pelz