Netzsch-gerätebau Gmbh

Georg Neumann

Alexander Schindler

Juergen Blumm

Marco Zier

Georg Storch

Jürgen Tschöpel

Reinhard Gschwendtner

Markus Hilmer

Ekkehard Füglein

Michel Bellmann

Leonhard Faulhammer

Wiebold Wurpts

Claas Luhmann

Stephan Lauer

Kai Dinges

Patrick Biermann

Jürgen Blumm

A thermal analysis of samples and proposes a device for a thermal analysis of a sample, having: a sample chamber for receiving a sample crucible including a crucible cover attached thereto, in the interior of which a sample to be analyzed is located, wherein the sample chamber has a chamber opening for introducing the sample crucible into the sample chamber; a temperature control mechanism for controlling the temperature of the sample chamber; a measuring mechanism for measuring a temperature of the sample and one or several further measured variables; a gas conveying mechanism for creating a gas atmosphere in the sample chamber; a chamber cover, which can be attached to the chamber opening of the sample chamber; and a piercing mechanism equipped with a needle, which is suitable to pierce a hole into the crucible cover of the sample crucible by means of the needle when the sample crucible is received in the sample chamber and when the chamber cover is attached to the chamber opening. A corresponding method for a thermal analysis of a sample, a sample crucible including a crucible cover, as well as a covering/piercing unit are further proposed as part of the invention.

Device and method for a thermal analysis of a sample

A material analysis device for analysing a material sample. The material analysis device is equipped with a—generally temperature-controllable—sample chamber and a sample holder, which, supported by at least one pillar, protrudes into the sample chamber, and a loading shaft, to one end of which force is applied by an exciter, and the other end of which bears a connecting member, with which it transmits force to the sample in a defined manner and loads same thereby.

Material analysis device with quick attachment

A device for thermal analysis. This device includes at least one thermoanalytical measurement device and at least one infrared spectrometer, wherein the infrared spectrometer is fully integrated into the thermoanalytical measurement device. The thermoanalytical measurement device and the at least one infrared spectrometer are connected to one another by a lift-swivel unit. The at least one infrared spectrometer is disposed above the thermoanalytical measurement device.

Thermoanalysis device

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Schoenwald, Germany

Georg Neumann