Klingelnberg Gmbh

Klingelnberg Ag

Klingelnberg Sohne Gmbh

Georg Mies

Günter Mikoleizig

Harald Wüster

Christof Gorgels

Rainer Engels

Frank Wellmann

Frank Welllmann

A coordinate measuring apparatus, comprising a rotatably driveable receptacle for a gear workpiece and a measuring assembly, and configured to perform feed movements and measuring movements of the measuring assembly relative to the gear workpiece on a plurality of axes, the measuring assembly including

Coordinate measuring apparatus with optical sensor and corresponding method

Device with a tactile system and with a contactlessly operating sensor, and corresponding method and use thereof

Method for analyzing surface waviness of tooth flanks of a gearwheel, comprising measuring two or more teeth of the gearwheel, wherein a deviation of their tooth flank geometry from the setpoint geometry is measured along at least one measuring path on each of the teeth; measuring at least one further tooth, wherein a deviation of its tooth flank geometry from the setpoint geometry is measured along at least one partial measuring path whose length is less than the length of the measuring path; and/or measuring at least one further tooth, wherein a deviation of the tooth flank geometry from the setpoint geometry is measured by touching at least one point on the tooth flank; associating a rotational angle with each measured value and determining a geometrically captured order spectrum by order analysis of the deviations plotted over the rotational angle, wherein one or more compensation and/or interpolation functions are determined.

Method for analyzing surface waviness

Roughness measurement probe () for scanning a surface (F), comprising an integratingly operating device () and an optical scanning device (), wherein the optical scanning device () is arranged directly on or in the integratingly operating device (), wherein the integratingly operating device () is designed, when scanning the surface (F), to predetermine a mean distance between the roughness measuring probe () and a larger region of the surface (F), and wherein the optical scanning device () is designed, when scanning the surface (F), to optically scan a smaller region of the surface (F) in a contactless manner, wherein the integratingly operating device () comprises an optical arrangement which is designed as a virtual skid in such a way that it images a light spot (LF) on the surface (F).

Roughness measurement probe, device with roughness measurement probe and method

A roughness measurement sensor (), comprising a sliding element and a sensor tip (), wherein the sensor tip () is arranged in the region of the extremal end of a sensor arm () which has a longitudinal extension parallel to a longitudinal axis (LA) and is mounted in a lever-like manner. In some embodiments, the sliding element is formed in the manner of a skid (), and the skid () lies, as viewed in a sectional plane (SE), perpendicularly to the longitudinal axis (LA), laterally adjacent to the sensor tip ().

Roughness measurement sensor, an apparatus with a roughness measurement sensor and the respective use thereof

A workpiece clamping system for a measuring machine includes a rotary table disposed in a workpiece rotation axis and includes a chuck for the concentric accommodation of a workpiece, a rotary drive for the rotary table, an upper centering tip mountable or mounted on the measuring machine in the workpiece rotation axis vertically opposed to the rotary table, and a lower centering tip mountable or mounted on the rotary table in addition to the chuck for accommodating a workpiece between the centering tips instead of in the chuck, wherein the lower centering tip is provided and formed to be concentrically clamped in the chuck instead of a workpiece, and in that the workpiece clamping system is provided with a conveying device for vertically or vertically and horizontally conveying the lower centering tip into and from its clamping position in the chuck.

Workpiece clamping system for a measuring machine

An apparatus having a roughness sensing system and a roughness measurement sensor, wherein a slide element and a probe tip come to operation, and method of use thereof. The slide element is arranged on an extreme end of a probe pin in the form of a scan-slide element. The probe tip is integrated into the probe pin, and the distance between the scan-slide element and the probe tip is predetermined. The roughness sensing system is a 1D-, 2D- or 3D-scanning system having a parallelogram configuration. The apparatus further has a serving device which enables moving the probe pin together with the scan-slide element and the probe tip jointly over a surface to be scanned.

Apparatus having a roughness measurement sensor and corresponding methods

Device and method for positioning a precision part on a turntable (). The device () comprises at least two distance sensors (), which operate in a contactless manner and are situated in a previously known configuration to a rotational axis (A) of the turntable (). The measurement axes () of the distance sensors () are radially oriented in the direction of the rotational axis (A) so that the measurement axes () of the distance sensors () meet in a virtual measuring point (MV). The distance sensors () are connected to analysis electronics (). Output signals (a., a., a.) of the distance sensors () may be processed on the basis of the analysis electronics (), in order to allow coaxial centering of the precision part () in relation to the rotational axis (A) upon placement of the precision part () on the turntable ().

Device and method for positioning a rotationally-symmetric precision part

Device having removable probe system and a stylus instrument. The probe system is connected to the stylus instrument in a zero position by the attractive force of the permanent magnet. A mechanical lever system is provided, which comprises a spring and, when the probe system is pulled out, transfers the probe system together with a part of the stylus instrument from the zero position into a replacing position through a displacement motion. At the same time, the permanent magnet is spatially separated from the probe system and the attractive force which acts between the probe system and the stylus instrument is reduced.

Device having removable probe system and measuring instrument having such a device

Device with a removable probe head () for measuring a workpiece, whereby the device comprises a receiving section () for attaching the probe head (). In the receiving section () sensors () in fixed, predefined positions are arranged. The removable probe head () comprises several counterpart elements, which interact with the sensors () if the probe head () is attached to the receiving section (), whereby a coding of the removable probe head () can be set in advance, by adjusting the position of the counterpart elements.

Device for recognizing a probe head used in a measuring instrument

Described is a device for machine tools or measuring apparatus for detecting the spatial position of a carriage movable in a coordinate axis along a guide with respect to a reference standard which is designed as a rectangular plate extending parallel to the guide of the carriage. Two opposed, parallel surfaces of the reference standard carry each a two-dimensional line grating. A position measuring system serves the function of determining continuously the spatial position of a support member fixedly connectible with the carriage. The position measuring system includes three optical incremental reading heads and one distance sensor. The support member is arranged on the movable carriage such as to prevent the support member from contacting the reference standard over the entire length of the travel while at the same time detection is being performed. Owing to the arrangement of the three reading heads and the distance sensor at accurately defined positions on the support member it is possible to determine the location and the spatial position of the support member and hence of the carriage connected therewith.

Apparatus for detecting the position in space of a carriage moveable along a coordinate axis

A device for measuring a rotationally symmetric precision part, having a dog, drivable via a drive, and a revolving centering means, the dog and the revolving centering means being positioned in such a way that a rotationally symmetric precision part to be measured may be non-positively clamped coaxially between dog and centering means. A first angle measuring system is assigned to the dog, which provides signals that permit the drive-side angular position of the dog to be stated, and a further angle measuring system is assigned to the revolving centering means, which provides signals that permit the output-side angular position of the centering means to be stated. Software means are provided which determine slip between the dog and the rotationally symmetric precision part through a comparative calculation on the basis of the drive-side angular position and the output-side angular position.

Device, CNC measuring device, and method for measuring a rotationally symmetric precision part

The invention is directed to a device for direct detection of the spatial position of a probe element in a multi-coordinate measuring apparatus, with a reference system comprised of at least one first standard and one second standard that are associated with coordinate axes of the measuring apparatus. The first standard is a planar standard with a line grating array. The second standard is non-contacting relative to the first standard and movable in two dimensions by means of a cross slide. Provision is made for a first position measuring system for determining the spatial position of the second standard with respect to the first standard, and for a second position measuring system for determining the spatial position of a carriage carrying a three-dimensional probe assembly, with respect to the second standard. The device forms in an associated multi-coordinate measuring apparatus a continuous measuring chain from the first standard to the tip of the probe element. This supplies directly a measurement result considering any guide inaccuracies, without the need to perform any path corrections.

Apparatus for detecting the position of a probe element in a multi-coordinate measuring device

A device aids the setter of a cutter head for cutting, e.g., milling or hobbing, of spiral bevel gears to align all rod-shaped blades with their tip cutting edges to an axial height which is as uniform as possible and to move them with their profile cutting edges to a correct radial position in the cutter head so that uniform chip removal can take place. The device has a stable arm which can be moved numerically controlled axially and radially to the cutter head, with positions which are continuously measured and with which each individual blade can be automatically pushed into its chamber in the cutter head. A probe which is connected to the arm measures the axial height of the tip cutting edge of each blade before, during and shortly after each blade is pushed in. An evaluation computer determines from the measurements of the probe and the simultaneously measured positions of the arm the value of the height of the tip cutting edge relative to the end face of the cutter head which is considered as a reference.

Cutter head adjustment device

A scanning head for completely measuring gears and gearlike workpieces on numerically controlled measuring instruments must also posses 3-D properties for scanning unknown contours. To that end, the scanning pin or probe must deflect of its own accord in the currently prevailing direction normal to the contour being scanned. Only those scanning heads, whose behavior is statically and dynamically the same in all arbitrary deflection directions, can do this. The new scanning head achieves this by providing, for the three spatial coordinates X, Y, Z, two leaf spring parallelograms (1, 2) attached one behind the other to the stationary scanning head base (4). The first parallelogram (1), which is pivotable about the horizontal axis, permits deflections of the scanning pin carrier (3) in the XZ plane and the second parallelogram (2) permits deflections in the Y direction. Through this decoupling, achieved by means of connecting element (15) and the double-jointed rods (26), the displaced mass can be sufficiently close to being equally great in all arbitrary deflection directions. Preferably, the new scanning head is so constructed that, if desired, a predeterminable deflection direction in the XZ plane can be imparted to the scanning pin carrier (3) by means of a rotatable device (30).

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Wipperfürth, Germany

Georg Mies