Intel Corporation

Geoffrey Kelly

James Edward Neeb

Yu Amos Zhang

Nathan S Blackwell

Sundar V Pathy

Shelby G Rollins

Jesse Armagost

Matthew Boelter

Embodiments described herein may be directed to receiving a plurality of data captured, respectively, by a plurality of test instruments coupled to a device under test, wherein a plurality of data elements within, respectively, the plurality of captured data are associated with a timestamp based upon a time a data element was captured. Embodiments may also analyze the received plurality of data captured, respectively, by the one or more test instruments, and graphically display at least a portion of the analyzed plurality of captured data to a user. Other embodiments may be identified herein.

Debug tool for test instruments coupled to a device under test

Growing community of inventors

Hillsboro, OR, United States of America

Geoffrey Kelly