U.S. Philips Corporation

Morpho Detection, Inc.

Koninklijke Philips Corporation N.v.

Ge Homeland Protection, Inc.

Ge Security, Inc.

General Electric Company

Yxlon International X-ray Gmbh

Morpho Detction, LLC

Ge Security Germany Gmbh

Koninklijke Philips Electrions N.v.

Geoffrey Harding

Bernd R David

Helmut Rudolf Strecker

Josef-Maria Kosanetzky

Jens-Peter Schlomka

Peter Michael Edic

Gerhard Martens

Wolfgang Wagner

Ulrich Neitzel

Jens Peter Schlomka

Johannes Paul Delfs

Peter Klaus Bachmann

Gabriel Zienert

Stephan Olesinski

Dirk Kosciesza

Rainer Willi Eckart

Helmut Rudolf Otto Strecker

Bernd Ulmer

Samit Kumar Basu

Mark Ernest Vermilyea

Joseph Bendahan

Erhard P Klotz

Forrest Frank Hopkins

Bernd Schweizer

Volker Van Elsbergen

Hans Barschdorf

Sondre Skatter

Pierfrancesco Landolfi

Bruno K B De Man

Jeffrey Seymour Gordon

Volker Doormann

Matthew Allen Merzbacher

Peter Flisikowski

Josef M Kosanetzky

Bernd Schreiber

Petrus Merkelbach

Franciscus L Thissen

Alfred G Meyer

Karl-Heinz Fischer

Peter Ypma

Manfred Beckmann

A computer-implemented method of handling a container includes performing a first scan of the container. The container includes objects therein. The scan includes irradiating the container with polychromatic x-rays with a first x-ray scanning system at a first geographic location and generating a first scan record using a processing device. The method also includes moving the container from the first geographic location to a second geographic location. The method further includes performing a second scan of the container including irradiating the container with polychromatic x-rays with a second x-ray scanning system at the second geographic location and generating a second scan record using a processing device. The method also includes comparing the first scan record and the second scan record. The method further includes determining the second scan record is substantially indistinguishable or distinguishable from the first scan record.

System for detecting counterfeit goods and method of operating the same

A method of performing a security inspection of a container including a plurality of objects includes irradiating the container with polychromatic x-rays, reconstructing a 4-D voxelized representation defining a momentum transfer spectrum, and generating a 3-D image by determining a single value at each voxel as a function of the momentum transfer spectrum. The method further includes segmenting the voxels into segments of contiguous voxels that map onto at least one object. The method also includes computing an aggregated momentum transfer spectrum over at least a portion of the contiguous voxels through at least one of aggregating the spectra of the contiguous voxels for each segment and defining a supervoxel that includes voxels with the object exclusively and voxels in a neighborhood, regardless of association with the object. The method further includes classifying the object as one of a threat and a non-threat based on the aggregated momentum transfer spectrum.

X-ray diffraction imaging system with signal aggregation across voxels containing objects and method of operating the same

An x-ray diffraction imaging (XDI) system includes a plurality of x-ray sources configured to generate x-rays directed toward an object. The XDI system also includes a primary collimator positioned a distance from the plurality of x-ray sources. A plurality of nodes are defined within the primary collimator at a plurality of node distances from the plurality of x-ray sources. Each node of the plurality of nodes defines an x-ray intersection region. The XDI system further includes a supermirror assembly including a plurality of mounting rails positioned adjacent the plurality of nodes.

X-ray diffraction imaging system with integrated supermirror

An x-ray diffraction imaging (XDI) system having a system axis includes at least one x-ray source configured to generate x-rays directed toward an object that includes at least one substance. The at least one x-ray source is further configured to irradiate at least one voxel defined within the object with x-rays arriving from a plurality of directions, each direction defined by an angle of incidence with respect to the system axis. The system also includes at least one detector configured to detect scattered x-rays after the x-rays have passed through the object. The system further includes at least one processor coupled to the at least one detector. The processor is programmed to generate a plurality of XDI profiles of the object voxel. Each XDI profile is a function of an associated angle of incidence.

Angle-dependent X-ray diffraction imaging system and method of operating the same

A multi-stage screening system for screening a container includes a pre-screening stage including a transmission X-ray device. The pre-screening stage is configured to generate constraint data associated with the contents of the container. The system also includes a screening stage including an X-ray diffraction imaging (XDI) device. The screening stage is configured to generate image data associated with the contents of the container. The system further includes a communication system coupled to the pre-screening stage and the screening stage. The communication system is configured to receive and transmit the constraint data and reconstruct at least one image of the container at least partially as a function of the constraint data and the image data.

Multi-stage security screening system and smart communication system

A method for correcting an X-ray diffraction (XRD) profile measured by an X-ray diffraction imaging (XDi) system is provided. The XDi system includes an anode, a detector, and a control system. The method includes obtaining an emission spectrum of the anode using the control system. The emission spectrum includes spectral structures. The method further includes calculating a piecewise spectral-correction function using the spectral structures in the emission spectrum, obtaining a measured spectrum of an object, and applying the spectral-correction function to the measured spectrum to generate a spectrally-corrected measured spectrum.

System and method for correcting X-ray diffraction profiles

A method for identifying a substance includes determining a first molecular interference function (MIF) for a first substance. The method also includes determining a second MIF for a second substance. The method further includes generating a residual MIF at least partially based on a comparison of the second MIF to the first MIF. The method also includes identifying the type of substance based on the residual MIF.

Method and system for deriving molecular interference functions from XRD profiles

A method for making a secondary collimator that includes at least one plate having a plurality of slits defined therein includes determining a gap thickness between plate positions of the secondary collimator based on at least one dimension of the at least one plate and fabricating a base plate from a base plate blank. The base plate includes at least two slots being spaced apart by the gap thickness. The at least one plate is inserted into a first slot of the at least two slots to form the secondary collimator.

Secondary collimator and method of making the same

A method for performing materials analysis of an object using an X-ray system includes generating an X-ray beam using an X-ray source having an anode and acquiring a scatter spectrum from Compton scatter produced when the X-ray beam interacts with the object. The scatter spectrum is acquired using an energy resolving detector. A Compton profile is extracted from the scatter spectrum by processing the scatter spectrum using a control system of the X-ray system. The Compton profile includes peaks at characteristic lines of the anode. The method further includes identifying a characteristic of a material of the object using the Compton profile, and outputting an indication of the characteristic of the material.

Method and system for performing materials analysis with reflected inelastic scatter

Methods, a processor, and a system for improving an accuracy of identification of a substance are described. One of the methods includes determining whether a relative molecular interference function of the substance includes at least one peak.

Methods, a processor, and a system for improving an accuracy of identification of a substance

System and method for XRD-based threat detection. An object is scanned with a first threat detection system. One or more alarm objects are identified. Data about the one or more alarm objects is passed from the first threat detection system to a second threat detection system and is used to move and/or to rotate the object in a predetermined ray path that decreases attenuation of scattered x-ray radiation. Also disclosed is a secondary collimator for XRD-based false alarm resolution in computed tomography {'CT') threat detection systems. The secondary collimator comprises one or more slit apertures configured to provide a multi-angle capability that extends a range of momenta for which XRD intensities are measured for a predetermined range of photon intensities.

System and method for XRD-based threat detection

A method for calibrating a detection system including a multi-focus X-ray source includes performing a scan of a calibration material using the detection system to acquire scan data, determining a diffraction profile of the calibration material using the scan data, deriving an actual scatter angle using the determined diffraction profile, deriving an offset angle using the determined actual scatter angle, storing the derived offset angle, and generating a table including the stored offset angle.

Methods and system for calibrating and correcting a detection system

A method for assembling a secondary collimator including a first face plate having a first surface and an opposing second surface is provided. The method includes positioning a lamella assembly on the first face plate, wherein the lamella assembly includes at least one radiation-absorbing material layer and at least one radiation-transmitting material layer, such that a first surface of the lamella assembly is adjacent the second surface of the first face plate. The method also includes coupling a second face plate to the first face plate and the lamella assembly such that a first surface of the second face plate is adjacent a second surface of the lamella assembly.

Secondary collimator and method of assembling the same

A method for developing a primary collimator is described. The method includes placing a primary collimator element at an intersection of a first set of at least two beams.

Systems and methods for developing a primary collimator

Systems and methods for reducing a degradation effect on a signal are described. One of the methods includes pre-processing data based on a scan of a reference object and a scan of a substance. The reference object includes a material having an atomic number ranging from and including forty to sixty.

Systems and methods for reducing a degradation effect on a signal

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Hamburg, Germany

Geoffrey Harding