Yokogawa Electric Corporation

Yokogawa Test & Measurement Corporation

Ando Electric Company

Gentaro Ishihara

Tohru Mori

Manabu Kojima

Hiroaki Matsukawa

A measurement apparatusaccording to this disclosure includes a controllerand a spectroscopehaving an optical element in which an apertureto pass light Lto be measured is formed. The controllerexecutes a first process to generate a synthetic spectrum Sr(i) of the narrowed light Lby synthesizing at least a first spectrum S() when a beam spot P of the light Lis at a first position xwithin the apertureand a second spectrum S() when the beam spot P of the light Lis at a second position xwithin the aperture. The first position xincludes a position shifted to one side in a predetermined direction D from a reference position xof the beam spot P within the aperture. The second position xincludes a position shifted to the other side from the reference position x

Measurement apparatus, measurement method, and program

A spectrum correction device includes an analyzer configured to analyze a shape of an optical spectrum obtained by measuring a light to be measured using spectrum data representing the optical spectrum, a corrector configured to perform a correction process according to the shape of the optical spectrum to the spectrum data based on an analysis result of the analyzer, and a synthesizer configured to synthesize the spectrum data corrected by the corrector.

Spectrum correction device, spectrum correction method, and non-transitory computer readable storage medium

A measurement device is provided. The measurement device includes a display, a detector, an operation unit, and a central processing unit. The detector detects a physical quantity and outputs measurement data based on the detected physical quantity. The operation unit includes plural keys for performing operation functions for operating the measurement device to detect and output the measurement data. The central processing unit controls the display to display the measurement data on the display, and to lock the operation unit such that all of the operation functions are temporarily inoperable except for an unlocking function and one or more of the operation functions that is set to be selectively operable even when the operation unit is locked.

Electronic device

A measurement device is provided for measuring a predetermined physical quantity which is contained in the measurement signal over a predetermined measurement range which relates to a specific property for the physical quantity according to the measurement signal which is obtained from an object for measurement so as to display the measurement result as an image in a measurement display which comprises a display range setting section which sets the measurement range, a measurement display generating section which generates the measurement display by using the measurement result in a display range which is set by the measurement range setting section among the measurement result which is measured over the measurement range which is set by the measurement range setting section, and a display section which displays the measurement display which is generated by the measurement display generating section. By doing this, it is possible to enhance an operability of the measurement device by varying the display range of the measurement result freely without changing the measurement scale.

Measurement device and method for displaying measurement result

Output light spectrum P(&#x3bb;) data from an optical amplifier and input light spectrum P(&#x3bb;) data of signal light are prepared, the difference between the P(&#x3bb;) and a value obtained by multiplying the P(&#x3bb;) by a provisional gain GT is determined (Steps S), for the obtained spectrum data, a noise removing process such as a moving average process and the like is performed and then, a spline interpolation process is also performed, whereby ASE light spectrum P(&#x3bb;) data is prepared and an ASE light level P ASE is determined (Steps Sthrough S). In addition, a noise figure-measuring devicecalculates the number of channels of WDM light and signal light wavelengths of the respective channels based on the P(&#x3bb;) or P(&#x3bb;), and performs analysis to calculate a noise figure NF and the like of an appointed wavelength range around the center of each wavelength thus calculated.

Noise figure-measuring device and noise figure-measuring method

In a method of analyzing wavelength-division multiplexed signal light, a plurality of reference wavelengths (&lgr;C -&lgr;Cm) as preliminary specified by the ITU-T standards are stored in a memory; then, maximum points of light intensity are determined from waveform data obtained by measuring an actual wavelength-division multiplexed optical spectrum; any one of the maximum points which at least differs in light intensity from the two minimum points, one being right to said maximum point and the other being left, by at least a channel identifying threshold (TH) level is identified as a channel, and the wavelength of the identified channel is determined as &lgr;Dn; then, the &lgr;Dn for each channel is rounded to the value of the nearest ITU-T grid wavelength &lgr;Cm so as to determine the reference wavelength &lgr;An for each channel and the determined reference wavelengths &lgr;An are stored in the memory.

Growing community of inventors

Tokyo, Japan

Gentaro Ishihara