Jeol Ltd.

Genki Kinugasa

Kouji Miyatake

Kotaro Asami

Kota Yanagihara

Ryuichi Isobe

Provided is a sample container which is for use with an X-ray fluorescence analyzer and which permits measurement of light elements in a liquid. The sample container includes a sealable first receptacle, a pressure adjusting valve for adjusting the pressure in the first receptacle, a second receptacle receiving a liquid sample (S) and having both a first opening and a second opening located inside and outside, respectively, of the first receptacle, and an analytical film closing off the second opening and transmitting X-rays.

Sample container and measuring method

There is provided a radiation detection apparatus capable of effectively discriminating between noise and X-ray signal. The radiation detection apparatus includes a detector for detecting radiation and producing a detector output signal, a first differential filter having a time constant and operative to differentiate and convert the detector output signal into a first pulsed signal, a second differential filter having a time constant greater than that of the first differential filter and operative to differentiate and convert the detector output signal into a second pulsed signal, and a noise detection section for detecting noise based on the difference in timing between peaks of the first and second pulsed signals.

Radiation detection apparatus and sample analysis apparatus

An X-ray fluorescence measurement apparatus has a sample tank, and a measurement unit that has an X-ray generator and an X-ray fluorescence detector. A film mechanism takes out a used film from a partitioning position between the sample tank and the measurement unit in a slide direction which intersects a direction of arrangement of the sample tank and the measurement unit, and feeds an unused film portion to the partitioning position in the slide direction. The film portions may alternatively be exchanged using cassettes.

X-ray fluorescence measurement apparatus

An analysis method using an X-ray fluorescence analyzer is provided in which an X-ray spectrum is acquired by detecting a secondary X-ray emitted from a specimen when the specimen is irradiated with a primary X-ray. The analysis method includes: acquiring a first X-ray spectrum obtained, with a take-off angle of the secondary X-ray being set as a first take-off angle; acquiring a second X-ray spectrum obtained, with a take-off angle of the secondary X-ray being set as a second take-off angle that is different from the first take-off angle; and obtaining information on an element in a depth direction of a specimen based on the first X-ray spectrum and the second X-ray spectrum.

Analysis method and X-ray fluorescence analyzer

A radiation detector is offered which can suppress generation of sum peaks. The radiation detector () has a radiation detection portion (), a first differential filter portion () for converting the output signal Sfrom the detection portion into a first pulsed signal Sa second differential filter portion () for converting the output signal Sinto a second pulsed signal Sa third differential filter portion () having a time constant longer than that of the second differential filter portion () and operative to convert the output signal Sinto a third pulsed signal San event detection portion () for outputting an event signal Sa pileup detection portion () for outputting a pileup signal Sin response to the ratio between the pulse height of the second pulsed signal Sand the pulse height of the third pulsed signal Sand a pulse height detection portion () starting to detect the pulse height of the first pulsed signal Sin response to the event signal Sand outputting a detection signal SThe pulse height detection portion () stops from outputting the detection signal Sin response to the pileup signal S

Radiation detector and sample analyzer

An X-ray spectrometer () capable of reducing the effects of noises includes: an X-ray detector () outputting a staircase waveform (S); a first differential filter () converting the staircase waveform (S) into a first pulsed signal (S); an event detection portion () detecting whether the first pulsed signal (S) has exceeded a threshold value; a noise event detection portion () determining whether the first pulsed signal (S) in excess of the threshold value is shorter than a given time; a second differential filter () converting the staircase waveform (S) into a second pulsed signal (S) having peaks whose heights correspond to the heights of the steps of the staircase waveform; a maximum value detection portion () detecting pulsed signal (S) if the first pulsed signal (S) exceeds a threshold value; and a decision portion () making a decision based on the noise event detection portion ().

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Tokyo, Japan

Genki Kinugasa