Harris Corporation

Itt Manufacturing Enterprises, Inc.

Exelis Inc.

Gene Olczak

Cormic K Merle

Thomas W Dey

Daniel Balonek

Malcolm O'Sullivan

Stephen D O'Donohue

A system for testing an optical surface, the system comprising a non-coherent light source, a detector, a test plate positioned between the non-coherent light source and the optical surface, the test plate separated from the optical surface by a gap, and a processor. The processer is configured to cause the non-coherent light source to illuminate the test plate and optical surface with non-coherent light, control the detector to capture an interferogram produced by interference between light reflected from the test plate and light reflected from the optical surface, and perform quantitative analysis on the interferogram to characterize aberrations in the optical surface.

QTIP&#x2014;quantitative test interferometric plate

A system for measuring deformation of at least one surface of an object including an interferometer for receiving illumination reflected from the surface of the object, and a surface treatment disposed on the surface of the object for providing a retro-reflective patina. The retro-reflective patina is configured to reflect the illumination from the surface of the object. The retro-reflective patina is attached to the surface of the object and may include a plurality of cube corners, or a plurality of dielectric spheres, or a combination of cube corners and dielectric spheres. Impinging light onto the object is provided by an optical source that may be separate from or integral to the interferometer. The impinging light may be directed toward the object through an objective lens, which is also used for receiving the illumination from the object. Alternatively, the impinging light may be directed toward the object by first bypassing the objective lens.

Surface deformation measuring system with a retro-reflective surface treatment

A system for detecting piston diversity between mirror segments. The system includes a pupil plane mask, a transform optical element, and an image detector. The pupil plane mask includes two or more open mask areas and two or more polarizers. Each polarizer is disposed within a respective one of the open mask areas. A first one of the two or more polarizers has a first polarization orientation, and a second of the two or more polarizers has a second polarization orientation.

Polarization modulated image conjugate piston sensing and phase retrieval system

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Pittsford, NY, United States of America

Gene Olczak