Growing community of inventors

Yorktown Heights, NY, United States of America

Gen Pei Lauer

Average Co-Inventor Count = 3.81

ph-index = 7

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 200

Gen Pei LauerAnthony J Annunziata (22 patents)Gen Pei LauerIsaac Lauer (19 patents)Gen Pei LauerJeffrey W Sleight (16 patents)Gen Pei LauerNathan P Marchack (15 patents)Gen Pei LauerJosephine B Chang (11 patents)Gen Pei LauerMichael A Guillorn (9 patents)Gen Pei LauerChung H Lam (7 patents)Gen Pei LauerMatthew Joseph BrightSky (7 patents)Gen Pei LauerEugene John O'Sullivan (5 patents)Gen Pei LauerEric Andrew Joseph (4 patents)Gen Pei LauerJanusz Jozef Nowak (4 patents)Gen Pei LauerAlexander Reznicek (3 patents)Gen Pei LauerQinghuang Lin (3 patents)Gen Pei LauerChandrasekharan Kothandaraman (3 patents)Gen Pei LauerSteve Donald Holmes (3 patents)Gen Pei LauerArmand A Galan (3 patents)Gen Pei LauerDeborah A Neumayer (2 patents)Gen Pei LauerAdam M Pyzyna (2 patents)Gen Pei LauerSzu-Lin Cheng (2 patents)Gen Pei LauerStephen W Bedell (1 patent)Gen Pei LauerStephen Mark Rossnagel (1 patent)Gen Pei LauerSebastian Ulrich Engelmann (1 patent)Gen Pei LauerJeong-Heon Park (1 patent)Gen Pei LauerJoseph S Newbury (1 patent)Gen Pei LauerJunghyuk Lee (1 patent)Gen Pei LauerChandrasekaran Kothandaraman (1 patent)Gen Pei LauerMasahiro Yamazaki (1 patent)Gen Pei LauerGen Pei Lauer (48 patents)Anthony J AnnunziataAnthony J Annunziata (103 patents)Isaac LauerIsaac Lauer (190 patents)Jeffrey W SleightJeffrey W Sleight (288 patents)Nathan P MarchackNathan P Marchack (65 patents)Josephine B ChangJosephine B Chang (248 patents)Michael A GuillornMichael A Guillorn (217 patents)Chung H LamChung H Lam (340 patents)Matthew Joseph BrightSkyMatthew Joseph BrightSky (55 patents)Eugene John O'SullivanEugene John O'Sullivan (124 patents)Eric Andrew JosephEric Andrew Joseph (92 patents)Janusz Jozef NowakJanusz Jozef Nowak (33 patents)Alexander ReznicekAlexander Reznicek (1,290 patents)Qinghuang LinQinghuang Lin (135 patents)Chandrasekharan KothandaramanChandrasekharan Kothandaraman (124 patents)Steve Donald HolmesSteve Donald Holmes (11 patents)Armand A GalanArmand A Galan (3 patents)Deborah A NeumayerDeborah A Neumayer (83 patents)Adam M PyzynaAdam M Pyzyna (16 patents)Szu-Lin ChengSzu-Lin Cheng (14 patents)Stephen W BedellStephen W Bedell (347 patents)Stephen Mark RossnagelStephen Mark Rossnagel (82 patents)Sebastian Ulrich EngelmannSebastian Ulrich Engelmann (44 patents)Jeong-Heon ParkJeong-Heon Park (34 patents)Joseph S NewburyJoseph S Newbury (8 patents)Junghyuk LeeJunghyuk Lee (5 patents)Chandrasekaran KothandaramanChandrasekaran Kothandaraman (4 patents)Masahiro YamazakiMasahiro Yamazaki (4 patents)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. International Business Machines Corporation (45 from 164,108 patents)

2. Other (2 from 832,680 patents)

3. Samsung Electronics Co., Ltd. (1 from 131,214 patents)

4. Tokyo Electron Limited (1 from 10,295 patents)

5. Globalfoundries Inc. (1 from 5,671 patents)


48 patents:

1. 11011698 - Enhanced coercivity in MTJ devices by contact depth control

2. 10497862 - Enhanced coercivity in MTJ devices by contact depth control

3. 10388857 - Spin torque MRAM fabrication using negative tone lithography and ion beam etching

4. 10256397 - Structure and method to reduce shorting and process degradation in stt-MRAM devices

5. 10243138 - Structure and method to reduce shorting and process degradation in STT-MRAM devices

6. 10170609 - Internal spacer formation from selective oxidation for Fin-first wire-last replacement gate-all-around nanowire FET

7. 10170608 - Internal spacer formation from selective oxidation for fin-first wire-last replacement gate-all-around nanowire FET

8. 10170698 - Spin torque MRAM fabrication using negative tone lithography and ion beam etching

9. 10084127 - Enhanced coercivity in MTJ devices by contact depth control

10. 9960347 - Structure and method to reduce shorting and process degradation in STT-MRAM devices

11. 9954062 - Stacked planar double-gate lamellar field-effect transistor

12. 9954063 - Stacked planar double-gate lamellar field-effect transistor

13. 9947863 - Structure and method to reduce shorting in STT-MRAM device

14. 9859375 - Stacked planar double-gate lamellar field-effect transistor

15. 9853210 - Reduced process degradation of spin torque magnetoresistive random access memory

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