Texas Instruments Corporation

Gautam Kapila

Vijay Kumar Reddy

A method includes, for a device and at each of a plurality of sampling frequencies, measuring a parameter of the device to generate a plurality of signals and each signal represents a time series of values of the parameter. Further, the method includes for each of the plurality of signals, identifying at least two stable states in the time series for each signal. Still further, the method includes determining a time constant associated with each stable state of each signal, determining a relationship between the time constants of each stable state and sampling frequency, and computing a final time constant value for each steady state by computing a derivative of the time constants as a function of sampling frequency relationship and comparing the derivative to a threshold.

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Richardson, TX, United States of America

Gautam Kapila