Maxlinear, Inc.

Gaurav Chandra

Shantha Murthy Prem Swaroop

Tao Zeng

Jianyu Zhu

Pawan Tiwari

Kaveh Moazzami

Rajesh Zele

A digital-to-analog converter (DAC) controller system may be configured for controlling switching in an associated digital-to-analog converter (DAC), based on a plurality of system inputs that include at least a first system input corresponding to an input applied to the DAC for controlling switching therein, and a second system input that includes a reference control signal. The DAC controller system may include a logic gate circuit that generates a gate output based on two gate inputs that include the first system input and an input set based on the second system input; and a plurality of timing circuits that generate timing outputs for controlling timing of switching in the DAC, which include at least one timing circuit that generates a timing output based on the gate output, with the timing output configured for application in conjunction with and for adjusting a timing output of another timing circuit.

Digital-to-analog converter (DAC) with partial constant switching

Aspects of a method and apparatus for converting an analog input value to a digital output code are provided. One embodiment of the apparatus includes a digital-to-analog converter, a comparator, and control logic circuitry. The digital-to-analog converter is configured to generate an analog reference value based on a received digital reference value. The comparator is configured to compare an analog input value to the analog reference value after expiration of an allotted settling time for the digital-to-analog converter and generate a comparison result indicative a relationship between the analog input value and the analog reference value. The control logic circuitry is configured to select the allotted settling time for the digital-to-analog converter based on a bit position of a digital output code to be determined, and update the bit position of the digital output code based on the comparison result.

Successive approximation register analog-to-digital converter

Systems and methods are provided for digital-to-analog conversions with adaptive digital offsets. A digital offset may be determined and applied to a digital input to a digital-to-analog converter (DAC), and digital-to-analog conversions are then applied via the DAC to the digital input with the digital offset. The digital offset may be set to account for one or more conditions relating to inputs to the DAC, with the one or more conditions affecting switching characteristics of one or more of a plurality of conversion elements in the DAC. The digital offset may be determined dynamically and adaptively, such as based on the input and/or conditions relating to the input. The adjustments may be selectively applied to the digital offset for particular input conditions.

Digital-to-analog converter (DAC) with digital offsets

Systems and methods are provided for managing dynamic element matching (DEM) in digital-to-analog converters (DACs). One or more parameters associated with the DAC and/or a signal being converted via the DAC; and based on the one or more parameters, conditions affecting dynamic element matching in the DAC may be assessed. Based on the assessing of the conditions, one or more adjustments may be determined and dynamically applied to the dynamic element matching in the DAC.

Digital-to-analog converter (DAC) with enhanced dynamic element matching (DEM) and calibration

Systems and methods are provided for digital-to-analog converters (DACs) with enhanced dynamic element matching (DEM) and calibration. DEM may be adapted based on assessment of one or more conditions that may affect the DACs or DEM functions thereof. The one or more condition may comprise amount of signal backoff. The adaption may comprise switching the DEM function (as a whole, or partially&#x2014;e.g., individual DEM elements) on or off based on the assess conditions. The DACs may incorporate use of calibration. The DEM and/or the calibration may be applied to only a portion of the DAC, such as a particular segment (e.g., a middle segment comprising bits between the MSBs and the LSBs).

Systems and methods are provided for adaptive configuration and control of digital-to-analog converters (DACs). Performance of a plurality of conversion elements in a digital-to-analog converter (DAC) may be assessed based on particular input conditions associated with a digital input to the DAC, and the DAC may be configured based on the assessing of performance. Each conversion element of the plurality of conversion elements handles a particular bit in the digital input. The configuring may comprise selecting a subset of the plurality of conversion elements, and setting only the subset of the plurality of conversion elements to apply a particular type of operations. The particular type of operations pertains to applying digital-to-analog conversions via the DAC, and the particular type of operations relates to or affects performance. The particular input conditions may comprise signal backoff.

Systems and methods are provided for digital-to-analog converter (DAC) with partial constant switching. A digital-to-analog converter (DAC) comprising a plurality of conversion elements may be configured to apply constant switching in only some of the conversion elements. Only conversion elements applying constant switching may incorporate circuitry for providing such the constant switching. Alternatively, each conversion element may incorporate constant switching circuitry and functionality, and the constant switching may then be turned on or off for each conversion element adaptively, such as based on input conditions.

Systems and methods are provided for digital-to-analog converter (DAC) with digital offsets. A digital offset may be applied to an input of a digital-to-analog converter (DAC), and digital-to-analog conversions are then applied via the DAC to the input with the digital offset. The digital offset is set to account for one or more conditions relating to inputs to the DAC, with the one or more conditions affect switching characteristics of one or more of a plurality of conversion elements in the DAC, and where each conversion element handles a particular bit in inputs to the DAC. The digital offset may be determined dynamically and adaptively, such as based on the input and/or conditions relating to the input. Alternatively, the digital offset may be pre-determined and fixed. One or more adjustments may be selectively applied to the digital offset for particular input conditions.

A low input voltage low impedance termination stage for current inputs may include an output stage for an electrical circuit, the output stage including input cascode transistors and stacked output transistors. A source-follower feedback path for the input cascode transistors may include a feedback transistor with its gate terminal coupled to a drain terminal of a first of the input cascode transistors, a drain of the feedback transistor coupled to a supply voltage, and a source terminal of the feedback transistor coupled to a current source. A current source may be coupled to the drain of the first of the input cascode transistors. The supply voltage may be coupled to the stacked output transistors via a load resistor. The input cascode transistors, the feedback transistor, and the stacked output transistors may include complementary metal-oxide semiconductor (CMOS) transistors.

Method and system for a low input voltage low impedance termination stage for current inputs

Methods and systems for a low input voltage low impedance termination stage for current inputs may include, in a semiconductor die, generating an output current proportional to an input signal, where the output current is generated by an output stage that may include a pair of input cascode transistors and at least one pair of stacked output transistors. A source-follower feedback path for the input cascode transistors may include a feedback transistor with its gate terminal coupled to a drain terminal of a first of the input cascode transistors, a drain of the feedback transistor coupled to a supply voltage, and a source terminal of the feedback transistor coupled to a current source that is coupled to ground. A current source may be coupled to the drain of the first of the input cascode transistors. The supply voltage may be coupled to the stacked output transistors via a load resistor.

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Carlsbad, CA, United States of America

Gaurav Chandra