Walmart Apollo, LLC

Oracle International Corporation

Oracle America, Inc.

Gaurav Agarwal

Arnon Katz

Mayan Cohen

Michal Russ

Rahul Ramkumar

Devadas Pattathil

Pushkar Raj Pande

Dinoop Dayanand

Naznin Richhariya

Ishwardutt Parulkar

Ali Vahidsafa

Venkatesh Aravamudhan

Raghuvamshi Vasudev Singh Thakur

Anup Shivarajapura

Paul J Dickinson

Syed Aman

Sriram Anandakumar

Krishna B Rajan

Sharanjeet Shingh Grewal

Juliet Monteleone

Calvin Qi

Methods, systems, and computer readable media for selecting a software defined wide area network (SD-WAN) link using network slice information are disclosed. One method occurs at an SD-WAN controller implemented using at least one processor, the method comprises: receiving a packet containing packet header information including at least one internet protocol (IP) address; determining, using the packet header information, a link selection rule for selecting an SD-WAN link for transmission, wherein the link selection rule uses transmission characteristics associated with the packet, wherein the transmission characteristics are discerned using network slice information associated with the packet; selecting, using the link selection rule, the SD-WAN link; and transmitting the packet via the SD-WAN link.

Methods, systems, and computer readable media for selecting a software defined wide area network (SD-WAN) link using network slice information

In some embodiments, a method can comprise retrieving an inventory layout of a facility and determining multiple pick lists at the facility. A first pick list for a first user and a second pick list of a second user each comprise a first common item. Receiving a first indication from the first mobile device that the first common item is not available at the facility. Analyzing a first set of rules of a substitute system to locate a first substitute item that is within a first predetermined percentage of a size of the first common item. After analyzing the first set of rules, automatically sending instructions to transfer the first route and the first pick list to the first mobile device.

Systems and methods for order filling

A customer check-in system includes a server computer of a store including a processor programmed to install a customer application on a customer mobile computing device, install an associate application on an associate mobile computing device, receive a signal from the customer device including a unique customer identification, an indication that the customer has checked-in to pick up an order, and a customer-selected time slot for picking up the order, obtain tracking information of a current location of the customer device, utilize the tracking information to estimate a travel time remaining until the customer device arrives at the store, transmit a signal to the associate device including the customer identification and a first estimated time remaining, and transmit at least one signal to the associate device including an updated estimated time remaining and an instruction to display a graphical representation of the updated time remaining on the associate device.

System and medium for checking-in a customer

A system for automatically checking-in a customer includes a database and a server computer including a processor coupled to a memory device. The processor is programmed to install a customer application on a customer mobile computing device, install an associate application on an associate mobile computing device, receive a signal from the customer device indicating that the customer device has automatically recognized a wireless hotspot about the store and including a unique customer identification associated with the customer device, retrieve a data record from the database including a customer profile associated with the unique customer identification, determine if the retrieved data record includes a customer order, and if the retrieved data record includes a customer order, then automatically check-in the customer and transmit a signal to the associate device including an indication that the customer is checked-in and available to pick-up the customer order.

System, method, and non-transitory computer-readable storage media for automatically checking in a customer

In some embodiments, a method can comprise receiving a request for one or more orders, and analyzing the one or more orders. Each of the one or more orders can comprise one or more items and at least a portion of the one or more items are available at a warehouse. The method can further comprise determining one or more pick lists based at least in part on the analyzing the one or more orders and also based at least in part on an inventory layout of the warehouse, determining a first route for a first pick list of the one or more pick lists, and determining a second route for a second pick list of the one or more pick lists, wherein the first pick list and the second pick list each comprise a first common item. Other embodiments of related methods and systems are also provided.

Display screen with a graphical user interface

Display screen portion with graphical user interface

Systems, methods, and other embodiments associated with at-speed testing of static random access memory (SRAM) are described. In one embodiment, a method includes loading, into a multi-stage pipeline of memory devices, a control pattern for testing a static random access memory (SRAM). The SRAM is tested by generating a test input that is based, at least in part, on the control pattern from the multi-stage pipeline of flip-flops. The test input is provided to the SRAM over a series of clock cycles that are at a core clock speed of the SRAM.

Testing of SRAMS

A method and system for testing a chip at functional (operational) speed. The chip may include an integrated circuit having a number flops and memory arrays arranged into logically functioning elements. Additional flops may be included to output to one or more of the other flops in order to provide inputs to the flops at the functional speed such that the receiving flops executing at the functional speed according to the received input at a next functional clock pulse to facilitate testing the chip at the functional speed.

Method of testing memory array at operational speed using scan

Growing community of inventors

Santa Clara, CA, United States of America

Gaurav Agarwal