Indian Institute of Science

Qualcomm Incorporated

Gaurab Banerjee

Kenneth Charles Barnett

Manas Behera

Jaideep Chauhan

Tv Prabhakar

Arnab Chakraborty

Pratikash Panda

Subrahmanyam Duvvuri

The present disclosure relates to a breathing assistance apparatus for providing a breathing assistance to a user. The breathing assistance apparatus includes a first/second source configured with a first/second buffer. The first/second fluid is controllably transferred from the first/second source to the first/second buffer using any or combination of a first/second pressure regulators and one or more first/second valves. A mixing chamber configured with the first buffer and the second buffer to receive and mix the first fluid and the second fluid. A delivery tank configured with the mixing tank to controllably receive the third fluid through one or more fourth valves and a third pressure regulator. A user feed mask having an inlet configured with the delivery tank and user's face facilitating breathing assistance to the user.

Breathing assistance apparatus

The present disclosure relates to an integrated wideband Radio Frequency (RF) amplifier, based on a complementary metal oxide semiconductor (CMOS) technology. In an embodiment the amplifier addresses the shortcomings of conventional wideband amplifiers and is based on a distributed amplifier (DA) topology which typically exhibit severe performance degradation when externally loaded with parasitic circuit elements. In an embodiment of the present invention a buffer amplifier at the output of a conventional DA is able to compensate the impact of parasitic elements. The disclosed circuit can be implemented by fabricating the wideband RF amplifier integrated circuit (IC) on a 130 nm CMOS technology or other comparable CMOS technologies.

CMOS wideband RF amplifier with gain roll-off compensation for external parasitics

A built-in self test (BiST) system is described. The BiST system includes a circuit-under-test. The BiST system also includes one or more embedded sensors. Each of the embedded sensors includes one or more switches connected to one or more nodes within the circuit-under-test. The BiST system further includes a signal generator. The BiST system also includes a bus interface. The bus interface provides for external access of the BiST system.

Methods and apparatus for providing a built-in self test

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Karnataka, India

Gaurab Banerjee