Tektronix, Inc.

Gary K Richmond

David A Holaday

Donald C Kirkpatrick

John C Calvin

An Arbitrary Waveform Generator has a controller programmed to generate a sequence of test waveforms using previously-defined waveform data files. The controller generates this series of test waveforms by direct synthesis to cause each waveform to contain a respective different predetermined amount of Rj, Sj and ISI jitter components. In this way, the Arbitrary Waveform Generator produces a sequence of waveforms incorporating varying amounts of ISI to sweep the ISI jitter components from an initial amount of ISI, for example, zero ISI, and continually increment the amount of ISI to a full unit interval of ISI in predetermined increments, for example, 0.1 UI steps.

Synthesis and generation of arbitrary waveforms with ISI components for jitter tolerance

A test and measurement instrument such as a Logic Analyzer, or the like, has at least one Reloadable Word Recognizer whose reference value can be loaded by a trigger machine with a current acquired data sample while data is being acquired. In a second embodiment useful for performing memory testing, the reloadable word recognizer is used in cooperation with two conventional word recognizers. In a third embodiment, a delay unit is employed to provide delayed input data words as reference words. In a fourth embodiment, an offset register and adder are used to modify the input data words before storing them. A fifth embodiment provides for substantially immediate use of base addresses of relocatable subroutines and stack-based variables recovered from a data stream acquired from a system under test.

Reloadable word recognizer for logic analyzer

A method and apparatus for real-time derivation of precise digital clock edges and synchronous logic samples from a digital signal having a clock channel and at least one data channel acquires a plurality of temporally offset analog samples during each of a sequence of sample periods and from consecutive samples where there is a logic level transition estimates an edge time. From the edge times for the clock channel an offset is added and applied to the at least one data channel to determine the synchronous logic samples for the data channel at each offset clock edge time.

Method and apparatus for high-speed synchronous digital acquisition derived in real -time from analog samples

A logic analyzer according to the subject invention employs a bi-directional counter that can be incremented in response to detection of certain events, and decremented in response to detection of other, different, events. Both an overflow (incremented to a predetermined count) and an underflow (decremented to a predetermined count) can be tested by a trigger machine of the Logic Analyzer.

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Beaverton, OR, United States of America

Gary K Richmond