Other

Jitterlabs LLC

Cypress Semiconductor Corporation

Gary Giust

Chwei-po Chew

Sung-Ki Min

An apparatus and method for analyzing phase noise in a signal. A plurality of signal samples, each signal sample representing a value of phase noise in a signal-under-test at a corresponding offset frequency, and filter data representing filter characteristics on a first side of a spectrum boundary, are used to derive filtered signal samples. A measure of noise is derived from the filtered signal samples. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.

Method and apparatus for analyzing phase noise in a signal from an electronic device

A third party provides an analysis of an analog signal property derived from an electronic device. A data set describing an analog signal property is obtained. The data set is derived from at least one measurement on the signal. A permission set based on data received from a supplier entity is maintained. A consumer entity having permissions are permitted access to information computed from the data set. A consumer input from the consumer entity is received. The consumer input represents a request for the analysis result. A determination is made based on permissions that the consumer entity is permitted access to the computed information. An analysis result from the data set is computed after receiving the consumer input. The analysis result is provided to the consumer entity. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.

Analysis of an analog property of a signal

An apparatus and method for receiving a signal waveform representing a signal-under-test (SUT), and a noise waveform representing noise measured in the absence of the SUT. An environment waveform is derived from the noise waveform and the signal waveform, and a jitter spectrum is computed from the environment waveform. An environment spur is detected, where the environment spur includes a spur in the jitter spectrum of the environment waveform. A jitter spectrum of the signal waveform is computed, and one or more signal spurs are detected, where the one or more signal spurs include one or more spurs in the jitter spectrum of the signal waveform. A measure of jitter for the SUT is derived from the one or more signal spurs after reducing the presence of at least one of the one or more signal spurs in response to detecting the environment spur.

Analyzing jitter with noise from the measurement environment

A clock timing signal derived from a clock timing source is converted into samples obtained at a plurality of sample times, each sample representing an amplitude of a clock timing signal at a corresponding sample time. A time-domain histogram of deterministic jitter (DJ) is derived from a plurality of the samples. A set of measurement-based data that is not derived from the samples is also received, from which a time-domain histogram of random jitter (RJ) is derived. A jitter measurement is determined by convolving the time-domain histograms of DJ and RJ. Tangible non-transitory computer-readable storage devices can contain instructions that when carried out on processor(s) carry out the above process An apparatus has a clock sampling unit and a signal analyzer to derive the measure of jitter. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.

Analyzing jitter in a clock timing signal

A lock-aid circuit and method is applied to a phase lock loop (PLL) having a voltage controlled oscillator (VCO), wherein the lock aid is coupled with the input of the VCO. In one example, the lock aid includes a Schmitt trigger having an output, a switch having an output and an input coupled to the output of the Schmitt trigger, and a voltage controlled current source coupled with the output of the switch.

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Santa Clara, CA, United States of America

Gary Giust