Ibex Innovations Limited

Kromek Limited

Gary Gibson

Ian Radley

Max Robinson

David Edward Joyce

Arnab Basu

Paul Scott

Neil Loxley

Martin Russell Senior

Kurt Scott

An x-ray apparatus comprises an x-ray source and an x-ray detector and there between a member that is configured to perturb x-ray photons incident thereon. The apparatus further comprises a first database of values representative of material type and material thicknesses, a second database of scatter radiation values indicative of material type and/or material thicknesses, a processor configured to perform an algorithm which compares the output signal of the x-ray detector with values in the first database and to output a most likely material and/or thickness from the first database; selects from the second database the scatter radiation associated with the material type and/or material thickness; and removes the scatter radiation from an output signal of the x-ray detector.

Scatter in x-ray apparatus and methods of their use

An x-ray X-ray imaging apparatus includes an x-ray detector () that is configured to convert incident x-ray wavelength photons directly into electronic signals, a position for a material under test (), an x-ray source (), and a structure () configured to perturb an x-ray energy spectrum, each lying on a common axis. The x-ray source () is arranged to direct an x-ray energy spectrum along the common axis to impinge upon the member, the structure () configured to perturb the x-ray energy spectrum, and positioned material under test (). The structure () lies between the x-ray source () and the member to one side of the position for material under test () intersecting the common axis, and the structure () includes at least three adjacent regions, each region different to immediately adjacent regions and configured to perturb the x-ray energy spectrum differently.

Multi-spectral x-ray detection apparatus

An x-ray detector apparatus includes at least one x-ray detector () having a position for a material under test (), an x-ray source (), and a plurality of structures () each configured to perturb an x-ray energy spectrum differently. The structures () may be placed in the path of the x-ray energy spectrum sequentially or concurrently. A plurality of x-ray detectors () may be formed into a linear array.

X-ray detector apparatus

An x-ray/gamma ray imaging apparatus includes a pixilated x-ray/gamma ray detector () including a member configured to detect incident x-ray/gamma ray wavelength photons, a position for a body under test (), an x-ray or gamma ray source (), and a structure configured to perturb the energy spectrum (), each lying on a common axis. The source is arranged to direct an x-ray gamma ray energy spectrum along the common axis to impinge upon a structure configured to perturb the x-ray energy spectrum and a positioned body/object under test. The structure and the position for the body under test lie between the source and the detector member, and the structure includes at least three adjacent regions, each region different to immediately adjacent regions and configured to perturb the x-ray energy spectrum differently. Detected photons are subject to a random noise reduction algorithm.

X-ray imaging apparatus and methods

An X-ray imaging apparatus is disclosed that includes an x-ray detector. The x-ray detector includes a member configured to convert incident x-ray wavelength photons into emitted visible wavelength photons, a position for a material under test, an x-ray source, and a structure configured to perturb an x-ray energy spectrum, each lying on a common axis. The x-ray source is arranged to direct an x-ray energy spectrum along the common axis to impinge upon the member, the structure configured to perturb the x-ray energy spectrum, and positioned material under test. The structure lies between the x-ray source and the member to one side of the position for material under test intersecting the common axis, and the structure includes at least three adjacent regions, each region different to immediately adjacent regions and configured to perturb the x-ray energy spectrum differently.

X-ray detection apparatus

X-ray imaging apparatus, which includes an x-ray detector. The x-ray detector comprises a member configured to convert incident x-ray wavelength photons into emitted visible wavelength photons, a position for a material under test, an x-ray source, and a structure configured to perturb an x-ray energy spectrum, each lying on a common axis. The x-ray source is arranged to direct an x-ray energy spectrum along the common axis to impinge upon the member, the structure configured to perturb the x-ray energy spectrum, and positioned material under test. The structure lies between the x-ray source and the member to one side of the position for material under test intersecting the common axis, and the said structure comprises at least three adjacent regions, each region different to immediately adjacent regions and configured to perturb the x-ray energy spectrum differently.

Method for the identification of a homogeneous material (e.g. a liquid) in a container (e.g. a bottle) by measuring its X-ray or gamma spectrum and deriving its specific attenuation function. The method comprises building a database of the attenuation functions of empty containers, of containers filled with various fluid materials and of the contained fluid materials itself (by subtracting or devoluting the empty-container-attenuation-function from the filled-container-attenuation-function), recording the spectrum of an unknown material in a container and comparing this spectrum to the spectra in the database.

Method for the identification of materials in a container

A method of and apparatus for obtaining radiation transmission data from a liquid in such manner that allows some data about relative proportions of constituent ingredients to be derived is described. A radiation source and a radiation detector system able to resolve transmitted intensity across a plurality of frequencies within the spectrum of the source are used to produce transmitted intensity data for each such frequency. Measured data is compared numerically to a mass attenuation data library storing mass attenuation data, individually or collectively, for a small number of expected constituent ingredients of the liquid to fit each intensity data item to the relationship given by the exponential attenuation law: I/I=exp [&#x2212;(&#x3bc;/&#x3c1;) &#x3c1;t] in respect of the constituent ingredients and derive therefrom an indication of relative proportions of each constituent ingredient.

Determination of composition of liquids

A method of and apparatus for obtaining radiation interaction data related to an image of an object. The method involves using a detector system for detecting and collecting spectroscopically resolvable information about incident radiation, and collecting one or more datasets of information at the detector after interaction with an object. Each dataset is resolved across at least three frequency bands within the spectrum of the source. The ratio between measured intensities is evaluated for at least two pairs of such frequency bands in a given intensity dataset to obtain a numerical indicator in functional relationship with a material property. The numerical indicator is then compared with a library of data characteristics of target materials. An apparatus is also disclosed for inspection of materials.

Growing community of inventors

Sedgefield, United Kingdom

Gary Gibson