Micron Technology Incorporated

Intelligent Design Systems, Inc.

Stratotech Corporation

Gary D Hamor

Michael Richard Spica

Patrick T Caraher

João Elmiro Da Rocha Chaves

Joseph M Ryan, Ii

Donald Shepard

Joseph M Ryan, Iii

Larry Joseph Koudele

Michael T Brady

William A Marcus

Warren G Siemers

A detection is made by a processing device allocated to a memory device test board of a distributed test platform that a memory sub-system has engaged with a memory device test resource of the memory device test board. A test is identified to be performed for a memory device of the memory sub-system. The test includes first instructions to be executed by a memory sub-system controller of the memory sub-system in performance of the test and second instructions to be executed by the processing device in performance of the test. The second instructions are to cause one or more test condition components of the memory device test resource to generate one or more test conditions to be applied to the memory device while the memory sub-system executes the first instructions. Responsive to a transmission of the first instructions to the memory sub-system controller, the second instructions are executed.

Intelligent memory device test rack

A test rack includes two or more memory device test boards where each memory device test boards includes two or more memory device test resources. Each of the two or more memory device test boards includes a separate processing device allocated to the memory device test resources of a corresponding memory device test boards. A processing device of a test board detects that a first memory sub-system has engaged with a first memory device test resource of the corresponding memory device test board. The processing device identifies a first test to be performed for a first memory device of the first memory sub-system, where the first test includes one or more first test instructions to be executed in performance of the first test. The processing device causes the one or more first test instructions to be transmitted to the first memory sub-system, where the first test is performed by the one or more first test instructions executing at the first memory sub-system.

A processing device of a memory device test resource detects that a memory sub-system has engaged with a first memory sub-system interface port and a second memory sub-system interface port of the memory device test resource. The processing device causes a power supply signal to be transmitted from the memory device test resource to the memory sub-system via the first memory sub-system interface port. The processing device identifies a test to be performed for a memory device of the memory sub-system, where the test includes one or more test instructions to be executed in performance of the test. The processing device causes the one or more test instructions to be transmitted from the memory device test resource to the memory sub-system via the second memory sub-system interface port, where the test is performed by the one or more test instructions executing at the memory sub-system.

Transmitting data and power to a memory sub-system for memory device testing

A data encoder-decoder which generates an encoded data element which can be stored in and retrieved from a reduced space memory element.

Method of encoding data

Data encoder system

Enclosures having adjustable clean gas flow environments and methods of enclosed pressure differential distribution technology. Specifically, clean gas flow enclosures, which provide for the isolation of materials from airborne micro-particulate contamination. An embodiment of the invention utilizes a small footprint, modular, selectable, clean-gas flow environment for handling and isolating materials. The environment can be a clean room class environment by providing filtered gas from a gas flow generator ( ) through a gas filter ( ) to a filtered gas flow space ( ). An embodiment of the invention provides a first plenum ( ) and a second plenum ( ) so that both a horizontal filtered gas flow and vertical filtered gas flow may be used separately or in combination within the same filtered gas flow space ( ).

Growing community of inventors

Mead, CO, United States of America

Gary D Hamor