Eastman-kodak Company

Gary A Hallenbeck

Wilbert F Janson, Jr

William B Jones

John Randall Fredlund

Methods are provided for determining an operating parameter for an image system. Evaluation images are obtained during composition of an archival image and the evaluation images are stored. The evaluation images are compared to determine common image elements and an area of importance is determined based at least in part upon some of the common image elements. An operating parameter is determined based upon analysis of the area of importance. Imaging systems that perform the methods are also provided.

Imaging method and system for determining camera operating parameter

An optoelectronic device component package comprises an optical element having a plano surface with a pattern of electrical conductors thereon, a photoelectric die having an optically active portion and die bond pads, and a printed circuit board having a pattern of electrical conductors thereon and further having an aperture for receiving the die. The die is attached to the plano surface of the optical element such that the die bond pads are electrically connected to corresponding electrical conductors of the optical element. The circuit board is attached to the plano surface of the optical element and the electrical conductors of the circuit board are electrically connected to corresponding conductors of the optical element. A protective means affixed to the die, the plano surface of the optical element, and a portion of the circuit board protects the device package. The die can be (1) an emitter or detector die for camera autofocus applications; or (2) a photometer die for exposure control applications.

Method of manufacturing an optoelectronic device package

An optoelectronic device component package comprises an optical element having a plano surface with a pattern of electrical conductors thereon, a photoelectric die having an optically active portion and die bond pads, and a printed circuit board having a pattern of electrical conductors thereon and further having an aperture for receiving the die. The die is attached to the plano surface of the optical element such that the die bond pads are electrically connected to corresponding electrical conductors of the optical elements. The circuit board is attached to the plano surface of the optical element and the electrical conductors of the circuit board are electrically connected to corresponding conductors of the optical element. A protective means affixed to the die, the plano surface of the optical element, and a portion of the circuit board protects the device package. The die can be (1) an emitter or detector die for camera autofocus applications; or (2) a photometer die for exposure control applications.

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Fairport, NY, United States of America

Gary A Hallenbeck